Transparent Illumination Matrix for Precision Surface Inspection

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Solution Overview

Problem

Current image inspection systems in factory automation lack the ability to effectively control the light-emitting position and radiation angle of light, which limits their precision in inspecting objects with varying surfaces.

Innovation Solution

An image inspection apparatus with a transparent illumination unit that includes a matrix of light-emitting units and an optical system allowing for controlled light-emitting position and radiation direction, enabling the calculation of distances on object surfaces by capturing multiple images while adjusting light-emitting positions and radiation directions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional illumination systems are used without controlling light-emitting position and radiation angle, then the system structure is simple, but inspection precision for objects with varying surfaces deteriorates

Engineering Contradiction:
Improveinspection precisionVSAvoidsystem structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The illumination unit is divided into multiple light-emitting units arranged in a matrix, where each unit can independently control light emission from specific positions at specific radiation angles. This segmentation enables precise control of illumination parameters without requiring complex mechanical adjustment mechanisms, thereby improving inspection precision while maintaining relatively simple system structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically adjusts the light-emitting position and radiation angle by selectively activating different light-emitting units in the matrix according to the object's surface characteristics. This dynamic control allows the illumination system to adapt to varying surface geometries, improving measurement precision without requiring complex mechanical moving parts.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If multiple images are captured while changing light-emitting position and radiation direction, then distance calculation accuracy improves, but inspection time increases

Engineering Contradiction:
Improvedistance calculation accuracyVSAvoidinspection time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system captures multiple images by periodically changing the light-emitting position and radiation direction through selective activation of different light-emitting units. This periodic illumination pattern allows efficient data collection for accurate distance calculation without requiring continuous mechanical movement, thereby reducing inspection time while maintaining measurement precision.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent replaces mechanical movement of illumination sources with electronic control of light-emitting unit activation. Instead of physically moving a single light source to change position and angle, the system electronically selects different units from the matrix, significantly reducing inspection time while maintaining the ability to capture multiple images for accurate distance calculation.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If large optical components are used to control radiation angles, then radiation direction control precision improves, but device size and complexity increase

Engineering Contradiction:
Improveradiation direction control precisionVSAvoiddevice size
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

Instead of using a single large optical component to control radiation angles, the system segments the illumination function across multiple small light-emitting units. Each unit inherently provides directional control based on its position in the matrix, eliminating the need for large optical components while maintaining radiation direction control precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system changes the parameter of light emission direction by selecting different light-emitting units from the matrix rather than using mechanical or optical components to physically alter beam direction. This parameter-based control achieves precise radiation angle control without increasing device size or complexity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution allows for precise inspection of objects by controlling light-emitting positions and radiation angles, reducing the need for large optical components and enabling accurate distance calculations, thus enhancing inspection accuracy and flexibility.

Implementation Method 1

has a light-emitting surface for radiating light to the object

Methodology Applied
Scientific EffectLight emission: Light

Data Source

PatentEP3531116B1Image inspection apparatus and image inspection method
Publication Date: 2024.05.01 OMRON CORP
  • EP3531116B1 patent drawingFigure 1
  • EP3531116B1 patent drawingFigure 2~3
  • EP3531116B1 patent drawingFigure 4

AI summary

An image inspection apparatus (1) includes: an image capturing unit (10); a transparent illumination unit (20, 120, 220, 320) which has a light-emitting surface (35) which radiates light to an object (W) and is configured to control a light-emitting position on the light-emitting surface (35) and a radiation direction of the light; and a control unit (100). The control unit (100) causes the illumination unit (20, 120, 220, 320) to change the light-emitting position and the radiation direction, causes the image capturing unit (10) to capture images of the object (W), identifies a light-emitting position and a radiation direction of the illumination unit (20, 120, 220, 320) when a measurement point (13) of the surface of the object (W) is illuminated from images of the object (W), and calculates a distance (D) to the measurement point (13) on the basis of the identified light-emitting position and the identified radiation direction.