Transparent Probe for High-Power Laser Beam Scanning
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Solution Overview
Problem
Current devices for scanning high-power laser beams are inaccurate and may be destroyed, and existing methods for measuring geometric parameters of high-power laser beams face challenges due to high power densities and limited spatial resolution.
Innovation Solution
A scanning device comprising a body made of optically transparent material with a probe area having light-deflecting structuring, allowing for high spatial resolution measurement of laser beams by deflecting a portion of the beam and using a detector to capture the deflected light, while being movable relative to the beam to scan various cross-sections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a sensor or element is placed in the beam to obtain a sensor signal, then measurement data can be obtained, but the sensor or element can be altered or destroyed by very high-power laser beams
Solution Approach 1:
A transparent measuring probe with light-deflecting structuring is introduced as an intermediary between the high-power laser beam and the sensor. The probe deflects a portion of the beam away from the sensor, allowing the sensor to measure the deflected light without being exposed to the full beam power that would destroy it.
Solution Approach 2:
The measuring probe extracts or separates a portion of the laser beam from the main beam path using light-deflecting structuring. This extracted beam portion is then directed to the sensor, enabling measurement while protecting the sensor from the full beam intensity.
2Reliability
If the beam is attenuated to protect the sensor, then the sensor is protected from damage, but thermal effects in the attenuator alter beam parameters and make measurement unreliable
Solution Approach 1:
The transparent measuring probe acts as an intermediary that deflects light without requiring attenuation. By using light-deflecting structuring rather than absorbing or scattering materials, the system avoids thermal effects that would alter beam parameters while still protecting the sensor.
Solution Approach 2:
The patent replaces the mechanical/thermal attenuation system with an optical deflection system. Instead of using attenuators that absorb energy and generate heat, the system uses refractive or reflective structuring to redirect the beam, eliminating thermal interference with measurements.
3Power
If multiple optical elements are used for beam attenuation, then beam power is reduced to safe levels, but contamination or dust on surfaces alters beam parameters
Solution Approach 1:
The transparent measuring probe serves as a single intermediary element that performs both beam deflection and power reduction in one component. This eliminates the need for multiple optical elements that would accumulate contamination, as the probe's transparent material maintains optical quality without requiring multiple separate attenuating surfaces.
4Measurement precision
If a pinhole or small aperture is used to scan the beam, then spatial resolution is achieved, but the aperture can be destroyed by very high-power densities
Solution Approach 1:
The transparent measuring probe with light-deflecting structuring replaces the vulnerable pinhole aperture. The probe's transparent material with embedded structuring achieves beam sampling and spatial resolution without creating a physical opening that would be destroyed by high-power densities.
Solution Approach 2:
The measuring probe uses composite construction with transparent material containing light-deflecting structuring. This composite structure achieves aperture-like sampling functionality while the surrounding transparent material protects against thermal damage from high-power beams.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate determination of geometric parameters like beam diameter, profile, and focus position with high spatial resolution and tolerance for high-power densities, avoiding damage to the measuring probe and improving measurement reliability.
Implementation Method 1
The body contains a probe area (30) having light-deflecting structuring
Data Source
AI summary
The invention relates to a measuring probe for scanning light beams (10) or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam (10) with high spatial resolution. For this purpose, a device is proposed which comprises a body (20), a probe area (30) and a detector (40). The body (20) is made of an optically transparent material and has a light beam entry surface (22), a light beam exit surface (23) and a detection light exit surface (25). The light beam entry surface (22) and the light beam exit surface (23) are for the most part smooth and polished. The body (20) includes the probe area (30) having light-deflecting structuring. The detector (40) is designed to detect at least part of the beam portion (15) deflected from the light beam (10) by the probe area (30). The body (20) and the light beam (10) are movable in two different directions of movement (51, 52) perpendicular to the direction of the axis (11) of the light beam (10) relative to each other. The probe area (30) has a shape whose two-dimensional projection on a surface perpendicular to the axis (11) of the light beam (10) approximately the same dimensions in the two different directions of movement (51, 52) perpendicular to the axis (11) of the light beam (10).