Transparent Transfer Gate CMOS Image Sensor Sensitivity

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Solution Overview

Problem

The reduction in size of photodiodes in CMOS image sensors leads to reduced sensitivity due to decreased optical charge generation, necessitating an improvement in the amount of generated optical charge despite the smaller pixel size.

Innovation Solution

Incorporating a transparent transfer gate formed from materials like nitrides, oxides, or compounds (e.g., GaN, ZnO, AlGaN, ITO) that allow light to permeate and generate additional optical charges in the channel area, increasing the area capable of generating optical charges and thus improving sensitivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If the size of photodiode is reduced to decrease unit pixel size, then the device complexity is reduced and integration density is improved, but the sensitivity is deteriorated due to decreased optical charge generation

Engineering Contradiction:
Improveunit pixel sizeVSAvoidsensitivity
Core Design Contradiction:
Area of moving objectVSReliability

Solution Approach 1:

The transfer gate is changed from opaque polysilicon to transparent material, fundamentally altering its optical properties. This allows light to pass through the transfer gate and generate optical charges in the channel area, thereby improving sensitivity while maintaining the reduced pixel size

Inventive Principle:
Principle #32Color changes

Solution Approach 2:

The transfer gate is formed using transparent materials such as transparent oxide semiconductors (e.g., IGZO - indium gallium zinc oxide) or transparent nitrides, creating a composite structure that combines electrical functionality with optical transparency. This enables the transfer gate to serve dual purposes: charge transfer and additional photocharge generation

Inventive Principle:
Principle #40Composite materials

2Area of moving object

If the size of photodiode is reduced to decrease unit pixel size, then the manufacturing precision requirements are reduced, but the amount of generated optical charge is deteriorated

Engineering Contradiction:
Improvephotodiode areaVSAvoidoptical charge
Core Design Contradiction:
Area of moving objectVSQuantity of substance

Solution Approach 1:

The light-receiving function is extended from the photodiode area to the channel area under the transfer gate. By making the transfer gate transparent, the system utilizes the previously non-functional channel region for charge generation, effectively adding a new dimension to photocharge production

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The transparent transfer gate acts as an intermediary that simultaneously performs charge transfer function and serves as an additional light-receiving element. The transparent material allows incident light to pass through and generate optical charges in the channel area, mediating between the photodiode and the readout circuit while contributing to charge generation

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The use of transparent transfer gates enhances the generation of optical charges, thereby improving sensitivity in CMOS image sensors even with reduced pixel size, as demonstrated by increased sensitivity measurements with materials like ZnO and AlGaN compared to polysilicon.

Implementation Method 1

The transfer gate may be formed, at least in part, of transparent material... light to permeate and generate additional optical charges in the channel area

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentUS7875491B2CMOS image sensors and methods of manufacturing the same
Publication Date: 2011.01.25 SAMSUNG ELECTRONICS CO LTD
  • US7875491B2 patent drawing
  • US7875491B2 patent drawing
  • US7875491B2 patent drawing

AI summary

A complementary metal-oxide-semiconductor image sensor may include: a semiconductor substrate; a photodiode formed on a first portion of the semiconductor substrate; a transfer gate formed on the semiconductor substrate, near the photodiode, to transfer optical charges accumulated in the photodiode; a floating diffusion area formed on a second portion of the semiconductor substrate, on an opposite side of the transfer gate from the photodiode, to accommodate the optical charges; and/or a channel area formed under the transfer gate and contacting a side of the photodiode to transfer the optical charges. The transfer gate may be formed, at least in part, of transparent material. A method of manufacturing a complimentary metal-oxide-semiconductor image sensor may include: forming the photodiode; forming the floating diffusion area, separate from the photodiode; and/or forming the transfer gate, near the photodiode, to transfer optical charges accumulated in the photodiode.