Tray Shield Ring Calibration for Inner Chamber Fit and Burr Control

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current methods for assembling and calibrating tray shields in wafer manufacturing are inaccurate and unable to monitor the size of the inner chamber and sputtered metal particles, leading to increased wafer breakage rates.

Innovation Solution

A calibration device using a first calibration ring for accurate assembly and a second calibration ring for real-time monitoring of the inner chamber size and sputtered metal particles, ensuring the tray shield meets the threshold size requirements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If manual assembly with screws is used, then assembly flexibility is maintained, but assembly accuracy is low and quality is uncontrollable

Engineering Contradiction:
Improveassembly accuracyVSAvoidassembly complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent introduces a calibration ring as an intermediary tool between the manual assembly process and the final assembly quality. The calibration ring serves as a physical reference standard that mediates the positioning and alignment during assembly, enabling equipment personnel to achieve consistent high accuracy without requiring complex automated assembly equipment. This intermediary tool bridges the gap between simple manual operation and precise manufacturing results.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If no calibration tool is used, then device complexity is low, but the size of the inner chamber cannot be monitored

Engineering Contradiction:
Improveinner chamber size monitoringVSAvoidcalibration device complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The calibration ring is designed as a simplified copy or representation of the ideal inner chamber dimensions. Instead of using complex measurement instruments, the patent creates a physical copy (the calibration ring) that embodies the correct dimensional standards. This copying approach allows for simple visual and tactile verification of inner chamber size without requiring sophisticated measurement devices, thus achieving precise monitoring with minimal added complexity.

Inventive Principle:
Principle #26Copying

3Reliability

If the tray shield is not calibrated, then assembly process is simple, but wafer breakage rate increases due to undetected size deviations

Engineering Contradiction:
Improvewafer breakage rateVSAvoidcalibration time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent implements calibration as a preliminary action that is performed before the tray shield is put into production use. By conducting the calibration check in advance using the calibration ring, potential size deviations and metal particle contamination are detected before they can cause wafer breakage. This preliminary verification prevents future failures and ensures reliable operation, making the small time investment in calibration worthwhile by avoiding costly wafer losses.

Inventive Principle:
Principle #10Preliminary action

4Manufacturing precision

If manual assembly without calibration is used, then productivity is high, but assembly quality is inconsistent and uncontrollable

Engineering Contradiction:
Improveassembly quality consistencyVSAvoidassembly speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The calibration ring enables the assembly process to be self-checking and self-correcting. Equipment personnel can independently verify the quality of their own assembly work using the calibration ring without requiring additional inspection equipment or personnel. The calibration ring provides immediate feedback that allows operators to self-assess and adjust their assembly technique, achieving consistent quality through self-service verification rather than external quality control systems.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS12604702B2Calibration device
Publication Date: 2026.04.14 DIODES INC
  • US12604702B2 patent drawing
  • US12604702B2 patent drawing
  • US12604702B2 patent drawing

AI summary

A method for calibrating a tray shield used for holding a wafer for processing is provided. The tray shield is in a ring shape. The method includes determining whether a first calibration ring is placeable into an inner chamber of the tray shield. When the first calibration ring is placeable into the inner chamber, the tray shield is determined to be usable for wafer processing. The first calibration ring is moved around inside the inner chamber to remove metal particles or burrs on the inner chamber, and thereafter, a wafer is loaded in the inner chamber. When the first calibration ring is not placeable into the inner chamber, the tray shield may be discarded. The method may also include assembling the tray shield utilizing a second calibration ring having an outer diameter equal to an inner diameter of the ring shape.