Trench-Gate Transistor Structure for Higher Channel Width in Pixels

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

As pixel count increases in image sensors, bitline setting time also increases due to higher bitline loading, leading to undesirable effects such as short channel effects and noise, while widening channel widths to enhance transconductance results in larger pixel sizes, which is undesirable.

Innovation Solution

The use of trench structures with a polygonal cross-section in source follower and row select transistors, which increases the effective channel width without increasing the planar channel width, thereby enhancing transconductance without enlarging pixel size.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If the channel width is increased to enhance transconductance, then the transconductance (Gm) is improved, but the pixel size increases

Engineering Contradiction:
ImprovetransconductanceVSAvoidpixel size
Core Design Contradiction:
PowerVSArea of stationary object

Solution Approach 1:

The patent transitions from a planar channel structure to a three-dimensional trench structure with polygonal cross-section. The channel extends vertically into the substrate, creating additional conductive pathways in the depth dimension. This dimensional change allows the effective channel width to exceed the planar channel width, thereby increasing transconductance without expanding the pixel footprint in the horizontal plane.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Power

If the channel length is shortened to increase transconductance, then the transconductance (Gm) is improved, but short channel effects and noise increase

Engineering Contradiction:
ImprovetransconductanceVSAvoidshort channel effects
Core Design Contradiction:
PowerVSReliability

Solution Approach 1:

The patent uses vertical channel extension into the substrate to compensate for the shortened horizontal channel length. By creating a three-dimensional trench structure, the effective channel width increases through the vertical dimension, allowing transconductance enhancement without requiring extreme channel length reduction that would cause short channel effects.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Measurement precision

If the pixel count is increased to improve resolution, then the resolution is improved, but the bitline setting time increases

Engineering Contradiction:
ImproveresolutionVSAvoidbitline setting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent changes the physical parameters of the transistor by creating a trench structure with polygonal cross-section. This structural modification increases the effective channel width and transconductance, which directly reduces the bitline setting time. The parameter change in transistor geometry enables faster signal processing, allowing higher pixel counts to be handled without increasing the bitline setting time.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11901383B2Transistor having increased effective channel width
Publication Date: 2024.02.13 OMNIVISION TECHNOLOGIES INC
  • US11901383B2 patent drawing
  • US11901383B2 patent drawing
  • US11901383B2 patent drawing

AI summary

Methods of forming transistors include providing a substrate material, forming a recess to a first depth in the substrate material, the recess corresponding to a gate region and extending in a channel length direction and a channel width direction that is perpendicular to the channel length direction, forming a trench structure in the substrate material by deepening the recess to a second depth using an isotropic process, forming an isolation layer on the substrate material, forming a gate portion of the isolation layer on the substrate material such that the gate portion of the isolation layer extends into the trench structure, and forming a gate on the isolation layer such that the gate extends into the trench structure.