Trench MOSFET Structure for High Blocking Voltage and Low RDS(on)

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Solution Overview

Problem

There is a need to improve the tradeoff between on-state resistance, dimensions, and blocked off-state voltage in transistors, particularly in MOS-type field-effect transistors, which face challenges in balancing high voltage blocking capability with low on-state resistance and compact size.

Innovation Solution

The design includes a semiconductor region delimited by a trench with an electrically-conductive element, a channel area in contact with the semiconductor region, and a doped area, where the conductive element is located opposite the semiconductor region, allowing for increased voltage blocking without increasing on-state resistance by optimizing the doping levels and trench structure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Force

If the transistor size is reduced and/or the blocked voltage is increased, then the on-state resistance increases

Engineering Contradiction:
Improveblocked voltageVSAvoidon-state resistance
Core Design Contradiction:
ForceVSReliability

Solution Approach 1:

The patent introduces a vertical conductive element extending through the trench into the substrate, adding a vertical dimension to the current path. This three-dimensional structure allows the current to flow through multiple paths (surface channel and vertical conductive element), effectively reducing the on-state resistance while maintaining high voltage blocking capability and compact footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The semiconductor structure is segmented into distinct regions: a surface channel area for voltage control, a trench structure for isolation and voltage blocking, and a vertical conductive element for current conduction. This segmentation allows each region to be optimized independently - the channel for low resistance control and the vertical element for low on-state resistance, resolving the contradiction between high voltage blocking and low on-state resistance.

Inventive Principle:
Principle #1Segmentation

2Area of stationary object

If the transistor size is reduced, then the voltage blocking capability decreases

Engineering Contradiction:
Improveoccupied surface areaVSAvoidblocked voltage
Core Design Contradiction:
Area of stationary objectVSForce

Solution Approach 1:

By transitioning from a planar transistor structure to a three-dimensional structure with vertical conductive elements extending into the substrate, the patent achieves high voltage blocking capability within a compact surface footprint. The vertical dimension provides additional space for voltage blocking without increasing the occupied surface area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The conductive element is nested within the trench structure, which itself is embedded in the substrate. This nested configuration allows the high voltage blocking function to be achieved within a compact volume, maintaining small surface area while providing sufficient voltage blocking capability through the layered, space-efficient structure.

Inventive Principle:
Principle #7Nested doll (Nesting)

3Reliability

If the on-state resistance is reduced, then the occupied surface area increases

Engineering Contradiction:
Improveon-state resistanceVSAvoidoccupied surface area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The vertical conductive element extending into the substrate provides an additional current conduction path in the vertical dimension, reducing on-state resistance without requiring additional horizontal surface area. This three-dimensional current path allows low resistance while maintaining compact footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent merges the voltage control function (surface channel) with the current conduction function (vertical conductive element) into a single integrated structure. This combination allows both low on-state resistance and compact surface area to be achieved simultaneously by utilizing both surface and subsurface regions for different functions.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS11757032B2Transistor structure
Publication Date: 2023.09.12 STMICROELECTRONICS (ROUSSET) SAS
  • US11757032B2 patent drawing
  • US11757032B2 patent drawing
  • US11757032B2 patent drawing

AI summary

A transistor is disclosed. In an embodiment a transistor includes a first semiconductor region of a substrate, a first trench delimiting the first semiconductor region on a first side, a first electrically-conductive element located in the first trench, a channel area in contact with the first semiconductor region and a first area of contact with the first semiconductor region, wherein the channel area and the first area of contact are on the same surface side of the substrate.