Triangular Imaging Array for Artifact-Free Reflective Specimen Inspection
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Solution Overview
Problem
Macroscopic inspection systems face challenges in eliminating imaging artifacts such as reflections of imaging devices and illumination hot spots when examining reflective specimens, which hinder accurate imaging and feature detection.
Innovation Solution
The system employs a specimen stage and multiple imaging devices arranged in a triangular array, along with a control system that captures images from different positions and stitching them to remove artifacts, while adjusting illumination using a light ring assembly and diffuser to provide variable illumination landscapes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single imaging device is used to capture images of reflective specimens, then the imaging process is simple, but imaging artifacts such as reflections of the imaging device and illumination hot spots appear in the captured images
Solution Approach 1:
The imaging system is divided into multiple imaging devices (at least two) positioned at different locations. Each imaging device captures images from its specific position, allowing the system to segment the imaging task across multiple devices. This segmentation enables the exclusion of imaging artifacts by combining images where each artifact is present only in specific portions, ultimately producing composite images free from all imaging artifacts.
Solution Approach 2:
The system merges images captured by multiple imaging devices through digital stitching to create composite images. By combining the strengths of multiple images (each free from certain artifacts), the system produces a final composite image that eliminates all imaging artifacts while maintaining complete specimen coverage.
2Reliability
If multiple imaging devices are used to eliminate imaging artifacts, then image quality improves, but device complexity increases
Solution Approach 1:
The multiple imaging devices perform the same imaging function but from different positions. This multi-functionality allows the system to capture the same specimen from multiple angles, enabling artifact elimination while maintaining a standardized imaging approach across all devices.
Solution Approach 2:
The system uses multiple copies of imaging devices positioned at different locations to capture images of the same specimen. These copies produce redundant information that can be processed to eliminate artifacts, with each imaging device serving as a backup and supplement to the others.
3Device complexity
If standard illumination is used for imaging reflective specimens, then the illumination system is simple, but imaging artifacts such as hot spots appear in the captured images
Solution Approach 1:
The illumination system provides different illumination conditions at different locations around the specimen. By positioning illumination sources at multiple locations and controlling their individual intensities, the system creates localized illumination patterns that prevent hot spots while ensuring adequate illumination across the entire specimen area.
Solution Approach 2:
The illumination system is made dynamic by independently controlling the intensity of multiple illumination sources. The control system can adjust illumination levels in real-time based on specimen properties and imaging requirements, allowing adaptation to different imaging scenarios while eliminating static illumination artifacts.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables artifact-free imaging of reflective specimens, improving feature detection and analysis by eliminating unwanted reflections and hot spots, and allowing for various illumination modes like brightfield, darkfield, and polarized light.
Implementation Method 1
a light ring assembly and diffuser to provide variable illumination landscapes
Implementation Method 2
the reflection of an imaging device positioned above the specimen can reflect off of the specimen
Implementation Method 3
polarized light; cross-polarized light
Data Source
AI summary
An inspection apparatus includes a specimen stage configured to retain a specimen, at least three imaging devices arranged in a triangular array positioned above the specimen stage, each of the at least three imaging devices configured to capture an image of the specimen, one or more sets of lights positioned between the specimen stage and the at least three imaging devices, and a control system in communication with the at least three imaging devices.