Triangular Prism Inspection Gauge for 3D Measuring Apparatus

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Solution Overview

Problem

Conventional inspection gauges for three-dimensional measuring apparatuses lack precision in inspecting motion errors across different probe positions, limiting the ability to perform high-precision inspections with a single gauge.

Innovation Solution

A three-dimensional-measuring-apparatus inspection gauge with targets arranged at positions corresponding to each vertex of a triangular prism, supported by a frame member, allowing precise measurement of distances between targets and enabling detection of anomalies in the measuring apparatus.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a conventional inspection gauge with spherical targets at triangular pyramid vertices is used, then the structure is simple and easy to manufacture, but the measurement precision for motion errors at different probe positions cannot be achieved

Engineering Contradiction:
Improvemotion error measurement precisionVSAvoidinspection gauge structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent transitions from a two-dimensional triangular pyramid arrangement to a three-dimensional triangular prism arrangement with six targets positioned at the vertices of the prism. This dimensional change enables the probe to approach targets from multiple spatial directions, thereby achieving high-precision measurement of motion errors at different probe positions while maintaining structural simplicity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If a single inspection gauge is used for all probe positions, then the device complexity is reduced, but the measurement precision for different probe positions deteriorates

Engineering Contradiction:
Improvenumber of inspection gaugesVSAvoidmotion error estimation precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The triangular prism inspection gauge with six targets positioned at the vertices serves multiple functions: it can be used for inspection at various probe positions and orientations. The gauge structure itself becomes universal, eliminating the need for multiple specialized gauges while maintaining high measurement precision through its three-dimensional target configuration

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS12241737B2Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatuses
Publication Date: 2025.03.04 MITUTOYO CORP
  • US12241737B2 patent drawing
  • US12241737B2 patent drawing
  • US12241737B2 patent drawing

AI summary

A three-dimensional-measuring-apparatus inspection gauge includes a plurality of targets to be measured with which a tip of a probe of a three-dimensional measuring apparatus comes into contact; and a frame member that supports the plurality of targets. The plurality of targets are arranged in positions corresponding to each vertex of a triangular prism.