Trigger Clock Circuit for Test Measurement Devices
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Solution Overview
Problem
Existing test and measurement devices face limitations in applying triggers without occupying input channels, leading to reduced versatility and increased internal signal lines for clock connections.
Innovation Solution
A test and measurement device with a trigger clock that generates repeated digital trigger clock timings to control the acquisition unit, eliminating the need for continuous signal lines between the signal generator and the clock, using singular events like Dirac impulses for triggering.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If an external signal generator is used to generate trigger signals, then triggering functionality is achieved, but one of several input channels is occupied reducing device versatility
Solution Approach 1:
The trigger signal generation function is extracted from the input channels and implemented as a dedicated internal trigger clock circuit. This separates the triggering function from the measurement input paths, allowing trigger signals to be generated internally without occupying any of the several measurement input channels, thus maintaining full versatility of all input channels for their intended measurement purposes.
Solution Approach 2:
The internal trigger clock serves multiple functions: it generates trigger signals for acquisition timing, provides timing references for the measurement system, and enables synchronized operation across multiple channels. This multi-functional design eliminates the need for external signal generators while preserving input channel versatility.
2Adaptability or versatility
If an internal signal generator is used to generate trigger signals, then input channel versatility is maintained, but the number of internal signal lines increases due to connection requirements
Solution Approach 1:
The trigger clock circuit is merged with the system clock infrastructure, using the same clock distribution network and timing resources already present in the measurement device. This integration approach allows the trigger function to share existing signal lines and hardware resources, avoiding the need for separate dedicated signal lines between the signal generator and clock circuits.
Solution Approach 2:
The internal trigger clock is self-contained and self-synchronized, using the device's own clock system to generate and distribute trigger signals. This self-service approach eliminates the need for external synchronization signals or additional inter-connect lines between separate generator and clock modules, reducing overall device complexity.
3Reliability
If continuous trigger signals are used for acquisition control, then triggering is achieved, but signal lines must remain continuously connected increasing complexity
Solution Approach 1:
Instead of using continuous trigger signals, the system employs periodic trigger clock timings generated at discrete intervals. These periodic timing pulses are sufficient to control the acquisition unit at the required sampling rates while allowing the signal lines to be inactive between pulses, reducing the need for continuously active connections and lowering overall system complexity.
Data Source
AI summary
A test and measurement device is described with at least one measurement channel, a measurement input, an analog to digital converter, and an acquisition unit. The test and measurement device has a trigger clock configured to generate repeated trigger clock timings, the trigger clock timings controlling the acquisition unit. In addition, a method for applying a trigger is described.