Trigger Probe for Electron Beam Orientation and Profile Reconstruction
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Solution Overview
Problem
Current methods for determining the orientation of non-circular and irregularly shaped electron beams in power distribution profiling are inaccurate due to variations in slit geometry and low signal-to-noise ratios, particularly when using Faraday cup diagnostics with oversized slits.
Innovation Solution
A modified Faraday cup system incorporating a configured external probe and electronic circuit to detect secondary and backscattered electrons, eliminating the need for oversized slits by using a timing or triggering signal to accurately orient and reconstruct the beam profile.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If an oversized radial slit is used to determine beam orientation, then the beam orientation can be easily identified, but the reconstruction of the beam is adversely affected
Solution Approach 1:
A trigger probe is introduced as an intermediary device to detect secondary and backscattered electrons from a predetermined position on the disk. This probe provides a timing or triggering signal that accurately indicates beam orientation without requiring an oversized slit, thus resolving the contradiction between ease of orientation identification and reconstruction accuracy
Solution Approach 2:
The mechanical approach of using an oversized slit to indicate beam orientation is replaced with an electronic detection system. The trigger probe detects electron signals and generates timing signals that are processed electronically to determine beam orientation, eliminating the need for geometric modifications to the slit structure
2Device complexity
If a single slit or knife-edge is used in Faraday cup, then the device complexity is reduced, but only one-dimensional beam profile can be obtained
Solution Approach 1:
The diagnostic approach is segmented into multiple independent measurements. Multiple slits are positioned at different angular locations around the beam path, with one slit serving as a trigger and others providing profile data. This segmentation allows reconstruction of the complete two-dimensional power distribution while maintaining relatively simple individual slit structures
Solution Approach 2:
The system transitions from one-dimensional single-slit measurement to two-dimensional power distribution mapping. By adding the angular dimension through multiple slits positioned at different orientations and using tomographic reconstruction algorithms, the complete spatial power distribution is obtained without significantly increasing the complexity of individual measurement components
3Ease of operation
If an oversized radial slit is used, then beam orientation determination is simplified, but signal-to-noise ratio deteriorates
Solution Approach 1:
The trigger probe acts as an intermediary detection device that provides a clean timing signal for beam orientation without the signal quality problems associated with oversized slits. It detects secondary and backscattered electrons from a predetermined position, generating reliable triggering signals that accurately indicate beam orientation
Solution Approach 2:
The orientation determination function is extracted from the measurement slits and assigned to a dedicated trigger probe. This separation allows the measurement slits to maintain optimal dimensions for accurate beam profiling while the trigger probe independently provides orientation information with high signal-to-noise ratio
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy of beam profiling by minimizing errors in slit geometry and improving signal quality, allowing for precise reconstruction of power distribution in electron or ion beams.
Implementation Method 1
positioning a probe to detect secondary and backscattered electrons from a predetermined position on the disk
Implementation Method 2
positioning a probe to detect secondary and backscattered electrons from a predetermined position on the disk
Implementation Method 3
A version of the Faraday cup diagnostic method can include an electrically conductive trap, which contains and measures a beam current
Data Source
AI summary
The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.