Trimmable Temperature Sensor Circuit for Process-Variation Compensation
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Solution Overview
Problem
Integrated circuits face challenges in accurately sensing temperature variations, which affect the operation of memory devices, leading to inefficiencies in adjusting operating parameters such as voltages, due to existing temperature sensing technologies that are not robust against manufacturing process variations.
Innovation Solution
An integrated circuit with a temperature-dependent voltage generator and a comparator circuit that uses temperature reference voltages, calibrated with trim codes, to accurately determine the operating temperature, thereby adjusting voltages optimally across the temperature range.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional temperature sensing technologies are used, then temperature sensing is provided, but manufacturing process variations cause inaccurate temperature measurement
Solution Approach 1:
The patent changes the physical parameter of voltage temperature coefficient from fixed to variable. The sensor circuit includes a first circuit generating a temperature-dependent voltage with a first temperature coefficient and a second circuit generating reference voltages with a second temperature coefficient. By making these coefficients different (TCV1 ≠ TCV2), the patent creates a differential measurement system that compensates for process variations and improves temperature measurement accuracy across different manufacturing conditions.
2Measurement precision
If temperature sensing component is added to integrated circuit, then temperature information is provided, but device complexity increases
Solution Approach 1:
The patent segments the temperature sensing function into distinct circuits: a first circuit for generating temperature-dependent voltage, a second circuit for generating reference voltages, and a third circuit for comparison. This segmentation allows each circuit to be optimized independently and simplifies the overall design by dividing the sensing and measurement functions into manageable modules that can be implemented in standard integrated circuit processes.
3Measurement precision
If multiple temperature reference voltages are generated, then temperature measurement accuracy is improved, but manufacturing complexity increases
Solution Approach 1:
The patent implements preliminary action by pre-calculating and storing reference voltage values in a lookup table during the design phase. The second circuit generates multiple reference voltages based on predetermined temperature coefficients, and these references are stored in memory for later use during normal operation. This approach simplifies manufacturing by eliminating the need for complex real-time reference voltage generation while maintaining high measurement accuracy through pre-computed reference values.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively compensates for manufacturing process variations and temperature changes, ensuring precise temperature sensing and optimal voltage adjustments, enhancing the performance and reliability of memory devices across various temperatures.
Implementation Method 1
a first circuit to generate a temperature-dependent voltage (TDV) that varies in response to a variation in an operating temperature of the integrated circuit
Implementation Method 2
one or more comparator circuits to compare individual ones of the plurality of temperature reference voltages with the TDV, to generate one or more output signals that are indicative of the operating temperature
Data Source
AI summary
An integrated circuit includes a memory and peripheral circuits with a temperature sensor used to automatically adjust operating voltages. The temperature sensor includes a first circuit to generate a temperature-dependent voltage (TDV) that is dependent on an operating temperature of the integrated circuit, and a second circuit to generate a plurality of temperature reference voltages, based on or more codes. One or more comparator circuits compare individual ones of the plurality of reference voltages with the TDV, to generate one or more comparison signals that are indicative of the operating temperature of the integrated circuit.