Trimming Circuit Voltage Consistency Semiconductor Systems
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Solution Overview
Problem
Semiconductor systems face challenges in generating consistent target voltages due to electrical differences, making it difficult to produce the same voltage with the same trimming code across different systems.
Innovation Solution
A trimming circuit that includes a code table storing unit, a test voltage generating unit, a trimming unit, and a calculating unit to generate and compare test voltages with a reference voltage, outputting pass signals to determine intermediate codes as trimming codes, which are used to generate target voltages for operations like programming, reading, and erasing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the same trimming code is used across different semiconductor systems, then the voltage generation should be consistent, but electrical differences between systems cause voltage inconsistency
Solution Approach 1:
The patent applies parameter changes by dynamically adjusting the trimming code based on measured electrical characteristics. The system measures actual voltage levels generated by the semiconductor system and uses this measurement to calculate a corrected trimming code that compensates for electrical variations, ensuring consistent voltage output across different systems despite manufacturing tolerances and environmental factors.
Solution Approach 2:
The patent implements feedback by measuring the actual voltage generated by the semiconductor system and using this measurement to adjust the trimming code. The voltage measurement unit measures the actual voltage level, and this measurement is fed back to the trimming code calculation unit, which then adjusts the trimming code to compensate for deviations from the target voltage, ensuring consistent performance across different semiconductor systems.
2Measurement precision
If traditional trimming code generation methods are used, then the process is simple, but the accuracy and reliability of voltage generation is insufficient due to electrical variations
Solution Approach 1:
The patent applies segmentation by dividing the trimming circuit into distinct functional modules: a voltage measurement unit for measuring actual voltage levels, a trimming code calculation unit for calculating the corrected trimming code based on measurements, and a trimming code storage unit for storing the calculated code. This modular segmentation allows each unit to perform its specific function with high precision while maintaining overall system manageability and reducing the impact of electrical variations.
3Productivity
If rapid trimming code generation is implemented, then productivity increases, but accuracy may be compromised due to electrical differences between systems
Solution Approach 1:
The patent applies preliminary action by pre-establishing the relationship between voltage measurements and trimming code adjustments through calibration data and algorithms. The system pre-calculates correction factors based on expected electrical variations, allowing rapid trimming code generation without sacrificing accuracy. When a semiconductor system is tested, the measurement and calculation process is expedited by using pre-established correction relationships, enabling fast trimming code generation that maintains high accuracy despite electrical differences between systems.
Data Source
AI summary
A trimming circuit may include a code table storing unit configured to store a plurality of test codes, a test voltage generating unit configured to generate test voltages in response to the test codes output by the code table storing unit, and a trimming unit configured to exchange and compare the test voltages and a reference voltage and output first and second pass signals. The trimming circuit may include a code table temporarily storing unit configured to store a test code from among the test codes as a first test code in response to the output of the first pass signal, and store a test code from among the test codes as a second test code in response to the output of the second pass signal, and a calculating unit configured to generate an intermediate code of the first and second test codes as a trimming code.