Triple Quadrupole Mass Spectrometer Interference Correction

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Solution Overview

Problem

Triple quadrupole mass spectrometers require complex and expensive instrument layouts to achieve reduced interference, especially when operating at unit mass resolution, which is not feasible with lower-resolution Q1 analyzers without increasing interference or reducing abundance sensitivity.

Innovation Solution

The method involves operating a triple quadrupole mass spectrometer by providing a first output from Q3 analyzing a desired mass-to-charge ratio and a second output analyzing a mass-to-charge ratio 0.9 to 1 amu lower, allowing for interference correction and enabling operation with a short, low-resolution Q1 analyzer at inferior vacuum conditions without increased interference or reduced sensitivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a high-resolution Q1 analyzer is used to achieve unit mass resolution and reduced interference, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improveunit mass resolutionVSAvoidinstrument layout complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent changes the operational parameters of the Q1 analyzer, allowing it to operate at lower resolution (greater than unit mass resolution) while compensating through modified operation of the collision cell and Q3 analyzer. This parameter change resolves the contradiction by achieving adequate interference rejection without requiring high-resolution Q1 hardware

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs dynamic operation where the Q1 resolution is adjusted based on the specific analytical requirements. By making the system dynamically adaptable rather than statically fixed at high resolution, the complexity is reduced while maintaining measurement precision when needed

Inventive Principle:
Principle #15Dynamics

2Object-affected harmful factors

If a high-resolution Q1 analyzer operating at unit mass resolution is used, then interference rejection is improved, but vacuum requirements become more stringent and cost increases

Engineering Contradiction:
Improveinterference rejectionVSAvoidvacuum system complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent changes the resolution parameter of Q1 from unit mass resolution to greater than unit mass resolution, which directly reduces the vacuum requirements. This parameter change allows the use of simpler vacuum systems while maintaining adequate interference rejection through the combined operation of Q1, collision cell, and Q3

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If a low-resolution Q1 analyzer is used to reduce complexity and cost, then device complexity is reduced, but interference rejection and abundance sensitivity deteriorate

Engineering Contradiction:
Improveinstrument layout simplicityVSAvoidabundance sensitivity
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent introduces the collision cell as an intermediary component between Q1 and Q3. This intermediary performs interference rejection through collisional processes, compensating for the lower resolution of Q1 and maintaining abundance sensitivity without requiring high-resolution Q1 hardware

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent optimizes the operational parameters of the collision cell and Q3 analyzer to compensate for the lower Q1 resolution. By adjusting collision energy, gas pressure, and Q3 transmission parameters, the system maintains measurement precision while using a simpler Q1 analyzer

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for interference-free quantification of elements by correcting ion detector measurements and maintaining abundance sensitivity, even with polyisotopic reaction or collision cell gases, while reducing the complexity and cost of the instrument layout.

Implementation Method 1

a mass filter, arranged to receive ions generated by the ion source, to select ions of a filter range of mass-to-charge ratios from the ions generated by the ion source

Methodology Applied
Scientific EffectElectromagnetic field interaction: Lorentz Force

Implementation Method 2

a reaction or collision cell, configured to receive ions transmitted by the mass filter and to react the received ions with a gas and provide or generate product ions thereby

Methodology Applied
Scientific EffectChemical reaction: Chemical Bonding

Implementation Method 3

a reaction or collision cell, configured to receive ions transmitted by the mass filter and to react the received ions with a gas

Methodology Applied
Scientific EffectCollision: Impact Force

Data Source

PatentUS11189473B2Mass spectrometer
Publication Date: 2021.11.30 THERMO FISHER SCI BREMEN
  • US11189473B2 patent drawing
  • US11189473B2 patent drawing
  • US11189473B2 patent drawing

AI summary

An elemental mass spectrometer uses a mass filter to select ions from ions received from an ion source and transmit the selected ions. A reaction or collision cell receives the transmitted ions and reacts or collides these with a gas to provide product ions thereby. A mass analyzer receives the product ions, analyzes them and provides at least one output based on detection of the analyzed ions. The elemental mass spectrometer is operated to provide a first output from the mass analyzer measuring ions within a first analysis range of mass-to-charge to provide a second output from the mass analyzer measuring ions within a second analysis range of mass-to-charge ratios and to correct the first output for interference on the basis of the second output.