TRNG Testing Device with Dynamic Thresholds for Latency Control
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Solution Overview
Problem
Existing methods for testing the quality of random numbers generated by True Random Number Generators (TRNGs) introduce uncontrollable latency and cannot be adapted to address a target error probability, limiting their effectiveness in cryptographic systems.
Innovation Solution
A device and method that apply statistical tests to bit sequences generated by TRNGs, dynamically determining thresholds based on the number of bits (N) and target error probability, allowing for flexible and latency-controllable testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If statistical tests are applied with fixed thresholds based on a fixed number of bits (20000 bits), then the testing can be performed according to standardization entities like NIST and BSI, but the latency becomes uncontrollable and the testing cannot be adapted to different target error probabilities
Solution Approach 1:
The patent applies dynamics by making the testing parameters (number of bits N and thresholds) variable and adaptable rather than fixed. The system dynamically adjusts N based on latency requirements and computes corresponding thresholds using mathematical formulas, allowing the testing process to adapt to different operational conditions and error probability targets while maintaining statistical validity.
Solution Approach 2:
The patent changes the parameters of the statistical testing by deriving thresholds as functions of N and the target error probability α. Instead of using fixed thresholds for a fixed 20000-bit sequence, the system computes thresholds dynamically based on the actual number of bits tested and the desired error probability, enabling flexible adaptation to different testing requirements.
2Reliability
If statistical tests are applied with fixed thresholds based on a fixed number of bits (20000 bits), then standardization compliance is achieved, but the testing cannot be adapted to address a target error probability
Solution Approach 1:
The patent implements parameter changes by deriving thresholds as mathematical functions of N and the target error probability α. This allows the system to adapt the testing parameters to different error probability requirements while maintaining compliance with standardization entities. The thresholds are computed dynamically based on the actual testing conditions rather than being predetermined for a fixed scenario.
Solution Approach 2:
The patent achieves universality by creating a testing framework that can handle different numbers of bits N and different target error probabilities α using the same mathematical approach. The general formulas for computing thresholds make the system universally applicable to various testing scenarios and error probability targets, not just the fixed 20000-bit case.
3Adaptability or versatility
If the number of bits N and target error probability are used to determine thresholds dynamically, then adaptability and latency control are improved, but the device complexity increases due to additional computation
Solution Approach 1:
The patent applies preliminary action by pre-computing and storing the mathematical formulas and computational logic for threshold determination. The system prepares the computational framework in advance, allowing for efficient real-time threshold calculation based on input values of N and α without requiring complex real-time analysis or additional hardware complexity.
Data Source
AI summary
Embodiments provide a device for testing a bit sequence generated by a Random Number Generator, wherein the device is configured to apply one or more statistical tests to the bit sequence, in response the detection of N bits generated by the Random number generator, each statistical test providing at least one sum value derived from the bits of the sequence, the testing device comprising: a comparator for comparing at least one test parameter related to each statistical test to one or more thresholds; a validation unit configured to determine if the bit sequence is valid depending on the comparison made by the comparator for each statistical test; wherein at least one of the test parameter and the at least one threshold is determined from N and from a target error probability.