Tunnel Inspection System Stabilizing Brightness for 3D Measurement

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Solution Overview

Problem

The existing three-dimensional shape measurement devices face challenges in improving measurement accuracy due to unstable brightness values of patterns formed on object surfaces, which affect the accuracy of acquired data.

Innovation Solution

An inspection system that includes a measurement device positioned inside a tunnel, capable of acquiring point cloud data with coordinate and brightness values using beams irradiated at various angles, and a movement mechanism to move the device to multiple points, along with an extraction method that stabilizes data extraction based on distance from the measurement point, ensuring consistent brightness values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If pattern light is used to measure three-dimensional shape, then shape measurement is achieved, but brightness values become unstable depending on object surface shape

Engineering Contradiction:
Improvethree-dimensional shape measurement accuracyVSAvoidbrightness value stability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent changes the illumination parameters by using multiple beams irradiated at different angles relative to the measurement point. This allows selecting data where the incident angle is close to perpendicular, stabilizing brightness values while maintaining measurement capability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent performs preliminary data extraction and filtering based on distance from measurement points before final shape calculation. By pre-selecting data with appropriate incident angles, it prevents brightness instability from affecting the measurement results

Inventive Principle:
Principle #10Preliminary action

2Area of stationary object

If data is extracted from multiple measurement points, then measurement coverage is improved, but data extraction precision decreases due to varying incident angles

Engineering Contradiction:
Improvemeasurement coverage areaVSAvoiddata extraction precision
Core Design Contradiction:
Area of stationary objectVSMeasurement precision

Solution Approach 1:

The patent divides the measurement process into segments by treating each measurement point independently. For each point, it extracts data only from beams with incident angles close to perpendicular, ensuring high precision while covering multiple points through systematic segmentation

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies different extraction criteria to different measurement points based on their local geometry. By adapting the beam selection to each specific measurement point's orientation and position, it maintains high data extraction precision across the entire measurement area

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances measurement accuracy by stabilizing brightness values and improving data extraction precision, particularly by aligning the measurement device's rotation center axis with the tunnel's center axis, ensuring incident angles are closer to perpendicular, thus improving data reliability.

Implementation Method 1

receiving reflected light of the beam resulting from scanning the wall surface

Methodology Applied
Scientific EffectReflected light: Reflection

Data Source

PatentUS20230367015A1Inspection system, extraction device, and inspection method
Publication Date: 2023.11.16 NEC CORP
  • US20230367015A1 patent drawing
  • US20230367015A1 patent drawing
  • US20230367015A1 patent drawing

AI summary

An inspection system, an extraction device, an inspection method, an extraction method, and a program that are capable of improving measurement accuracy are provided. An inspection system includes: a measurement device being arranged at a measurement point inside a tunnel, having a reference point, and acquiring a plurality of pieces of data including coordinate values and brightness values of a wall surface of the tunnel as point cloud data by using one or more beams irradiated in irradiation directions at a plurality of different angles to the reference point and receiving reflected light of the beam resulting from scanning the wall surface; a movement means for moving the measurement device to a plurality of measurement points inside the tunnel; and, in the point cloud data acquired by the measurement device for each measurement point, an extraction means for extracting data, based on a distance from the measurement point.