Tunnel Junction Laminated Film With Hafnium for STT-MRAM Thermal Stability
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Solution Overview
Problem
Miniaturizing STT-MRAM elements for high-density magnetic memory leads to decreased thermal stability of the recording layer, compromising data retention and nonvolatility.
Innovation Solution
Incorporating a hafnium layer adjacent to the first ferromagnetic layer in a tunnel junction stacked film, enhancing perpendicular magnetic anisotropy and improving thermal stability of the recording layer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the STT-MRAM element is miniaturized to achieve high-density magnetic memory, then the storage density increases, but the thermal stability of the recording layer decreases
Solution Approach 1:
The invention uses a composite material structure by introducing a hafnium layer adjacent to the CoFeB recording layer. This composite structure (CoFeB + Hf) creates interface magnetic anisotropy that enhances perpendicular magnetic anisotropy energy, thereby improving thermal stability while maintaining the miniaturized high-density configuration. The hafnium layer serves as a non-magnetic metal that modifies the magnetic properties of the adjacent ferromagnetic layer through interface effects.
2Volume of moving object
If the recording layer thickness is reduced to enable miniaturization, then the device size decreases, but the thermal stability factor decreases
Solution Approach 1:
The invention changes the magnetic anisotropy parameter by introducing the hafnium layer, which induces interface magnetic anisotropy. This parameter change compensates for the reduction in thermal stability factor caused by thinner recording layers. The perpendicular magnetic anisotropy energy is enhanced through the interface between CoFeB and Hf, allowing thin recording layers to maintain sufficient thermal stability for data retention.
3Power
If a ferromagnetic layer with high spin orbit interaction is used to increase spin polarizability, then the magnetization reversal efficiency improves, but the damping constant increases
Solution Approach 1:
The hafnium layer acts as an intermediary between the CoFeB recording layer and the surrounding structure. It modifies the interface properties to enhance perpendicular magnetic anisotropy while maintaining low damping constant. The Hf layer serves as a mediator that enables efficient spin transfer torque magnetization reversal without the adverse effects of high damping that would result from using heavy metals with strong spin-orbit coupling.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The hafnium layer enhances the thermal stability of the magnetization, allowing for a tunnel junction stacked film and magnetic memory element with high thermal stability and nonvolatility.
Implementation Method 1
the perpendicular magnetic anisotropy of the first ferromagnetic layer is improved, and as a result thereof, a thermal stability of a magnetization of the first ferromagnetic layer adjacent to the hafnium layer is improved
Implementation Method 2
when a current flows through the MTJ, polarized electron spins flow into the recording layer, and the magnetization direction of the recording layer is reversed by the spin transfer torque induced by the polarized electron spins
Data Source
AI summary
Provided are a tunnel junction stacked film having a high thermal stability, and a magnetic memory element and a magnetic memory using the tunnel junction stacked film. A tunnel junction stacked film 1 includes a recording layer 14 including a first ferromagnetic layer 24 containing boron, a tunnel junction layer 13 adjacent to the recording layer 14, and a reference layer 12 adjacent to the tunnel junction layer 13, wherein the first ferromagnetic layer 24 and the reference layer 12 are magnetized in a perpendicular direction with respect to a film surface, and the recording layer 14 includes a hafnium layer 25 adjacent to the first ferromagnetic layer 24.


