TVS Diode Series Testing via Switch Bypass
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Solution Overview
Problem
Current methods cannot effectively test individual transient voltage suppressor (TVS) diodes in series configurations due to high test voltages, making it impossible to ensure each diode is functioning and the entire module is operational.
Innovation Solution
Incorporating a switch assembly with MOSFET, IGBT, or NPN transistors to bypass diodes, allowing for testing at lower voltages by connecting test lines between pairs of diodes and using a switching module to control the switches, reducing the test voltage and enabling sequential testing of each diode.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Strength
If TVS diodes are connected in series to handle high voltage, then the TVS can suppress higher voltage transients, but the test voltage required to test all diodes becomes too high to test
Solution Approach 1:
The patent divides the series-connected TVS diodes into separate testable segments by introducing switch assembly. Each switch can bypass individual diodes or groups of diodes, allowing the test voltage to be applied across only a subset of diodes at a time. This segmentation enables testing at lower, safer voltage levels while maintaining the overall high-voltage suppression capability of the full series string.
Solution Approach 2:
The switch assembly acts as an intermediary between the test equipment and the TVS diodes. By controlling which diodes are bypassed and which are tested, the switch assembly mediates the test voltage distribution, allowing individual or partial testing of the diode string without requiring full-series testing at dangerous voltage levels.
2Reliability
If all TVS diodes are tested together at full voltage, then complete module functionality can be verified, but the high voltage makes individual diode testing impossible
Solution Approach 1:
The switch assembly enables segmentation of the TVS diode string into individually testable units. By selectively closing or opening switches, each diode or group of diodes can be isolated for individual testing while maintaining the ability to test the complete series string for overall functionality verification.
Solution Approach 2:
The switch assembly provides dynamic reconfiguration capability, allowing the test setup to change from testing all diodes together to testing individual diodes or subsets. This dynamic switching enables flexible testing strategies that can verify both individual diode health and overall module functionality at appropriate voltage levels.
3Ease of operation
If switch assembly is added to enable individual diode bypassing, then lower voltage testing becomes possible, but device complexity increases
Solution Approach 1:
The switch assembly serves multiple functions: it enables individual diode bypassing, allows selective grouping of diodes for testing, provides test point access, and maintains the ability to test the complete series string. This multi-functionality justifies the added complexity by providing comprehensive testing capability at reduced voltage levels.
Solution Approach 2:
The switch assembly is controlled by a switching module that can automatically sequence the bypassing of diodes based on startup signals or test requirements. This self-service capability reduces the need for manual intervention and simplifies the testing process despite the added hardware complexity.
Data Source
AI summary
A transient voltage suppressor (TVS) can include an input line, a return line, and a plurality of TVS diodes disposed in series between the input line and the return line. The TVS can include a switch assembly operatively connected to the plurality of TVS diodes and configured to bypass at least one of the plurality of TVS diodes to allow a remainder of the plurality of TVS diodes to be tested at a voltage that is lower than if the switch assembly were not employed.