Two-Point Offset Correction Circuit for Silicon Photonic Receivers

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Solution Overview

Problem

Silicon photonic integrated circuits (PICs) face signal corruption due to offset issues caused by component variations during fabrication and temperature changes, which can be amplified by gain mechanisms, leading to dynamic offset in common mode voltage across opto-electronic receiver circuits.

Innovation Solution

A circuit structure with a controller that measures and modifies operational parameters using offset polarity detector-low pass filter (OPD-LPF) circuits at multiple points to detect and correct signal offset, incorporating a first and second OPD-LPF circuit connected to the controller to assess and adjust the signal, thereby reducing offset corruption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If gain is increased to amplify signal, then signal strength is improved, but offset is amplified to a level that destroys the signal

Engineering Contradiction:
Improvesignal strengthVSAvoidoffset amplification
Core Design Contradiction:
PowerVSObject-generated harmful factors

Solution Approach 1:

The patent extracts and removes the offset component from the signal path before amplification occurs. By detecting and subtracting the offset at the input stage, the harmful offset component is separated from the useful signal, allowing subsequent gain amplification to enhance only the desired signal without proportionally amplifying the offset.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent performs offset detection and correction as a preliminary action before the signal enters the high-gain amplification stages. The offset measurement and compensation occur at the input stage, preparing the signal for subsequent amplification by removing the harmful offset component in advance, thereby preventing offset destruction of the amplified signal.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If offset correction is implemented at multiple points in the circuit, then signal fidelity is improved, but device complexity increases

Engineering Contradiction:
Improvesignal fidelityVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the offset correction function into distinct modular components: offset detection circuits at multiple points, separate correction circuits for each detected offset, and individual feedback loops. This segmentation allows each component to be independently optimized and maintained, managing overall system complexity through modular architecture while achieving comprehensive offset correction across multiple circuit stages.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20240243713A1Circuit and method for measuring and correcting signal offset at two points
Publication Date: 2024.07.18 GLOBALFOUNDRIES DRESDEN MODULE ONE LLC & CO KG
  • US20240243713A1 patent drawing
  • US20240243713A1 patent drawing
  • US20240243713A1 patent drawing

AI summary

A circuit structure including: a first amplifier stage having an input, and a second amplifier stage connected to the first amplifier stage. The second amplifier stage has an output. The first amplifier stage and the second amplifier stage carry a signal. A controller is configured to measure and modify at least one operational parameter of the signal. A first offset polarity detector-low pass filter (OPD-LPF) circuit connects the second amplifier stage output to the controller through a first controller input. A second OPD-LPF circuit connects the second amplifier stage to the controller through a second controller input. The controller measures an operational parameter of the signal for offset based on input from the first OPD-LPF circuit and the second OPD-LPF circuit. The controller modifies the operational parameter of the signal to correct signal offset.