Two-Stage Object Analysis Using Transmission and Scattering Spectra
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Solution Overview
Problem
Current diffractometry methods for analyzing objects are inefficient and time-consuming, particularly in identifying materials in high-volume objects and in applications like detecting explosives in baggage, due to the need for precise energy resolution and lengthy data acquisition processes.
Innovation Solution
A method involving two parts: a fast initial analysis using a transmission spectrum to eliminate non-suspicious objects, followed by a more detailed scattering spectrum analysis only for suspicious objects, utilizing a single or dual spectrometric detector system to acquire both transmission and scattering spectra, and comparing characteristics with calibration data for material identification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If diffractometry is used to analyze objects with precise energy resolution, then measurement precision is improved, but analysis time increases significantly
Solution Approach 1:
The patent segments the analysis process into two distinct stages: a first stage using transmission spectrum acquisition for rapid screening, and a second stage using scattering spectrum acquisition for detailed analysis only of suspicious objects. This segmentation allows the system to maintain high measurement precision when needed while significantly reducing average analysis time by quickly eliminating non-suspicious objects.
Solution Approach 2:
The patent applies preliminary action by performing a quick transmission spectrum analysis before the more time-consuming scattering spectrum analysis. This preliminary screening step prepares the system by identifying only those objects that require further detailed examination, thereby preventing unnecessary time investment in analyzing obviously non-suspicious objects.
2Measurement precision
If scattering spectrum analysis is performed on all objects, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The patent divides the object population into two groups: suspicious objects that undergo full scattering spectrum analysis for high-precision material identification, and non-suspicious objects that are quickly screened using transmission spectrum only. This segmentation maintains high productivity by avoiding unnecessary detailed analysis while preserving measurement precision for objects that truly require it.
Solution Approach 2:
The patent applies partial action by performing only the necessary level of analysis for each object. Most objects receive partial analysis (transmission spectrum only), while a small subset receives the full, more precise analysis (scattering spectrum). This approach maintains overall productivity while ensuring sufficient precision for security-critical cases.
3Device complexity
If a single detector is used for both transmission and scattering measurements, then device complexity is reduced, but measurement precision may be compromised
Solution Approach 1:
The patent employs a dynamic detector system that can change its geometric configuration relative to the object and radiation source. The single detector is positioned at different angles and locations to alternately perform transmission measurements (behind the object) and scattering measurements (at small angles). This dynamic repositioning allows one detector to fulfill the roles that would traditionally require multiple fixed detectors, maintaining measurement precision through proper geometric positioning while reducing device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces analysis time by quickly eliminating non-suspicious objects and focusing detailed analysis on suspicious ones, achieving efficient and accurate material identification with a considerable time savings.
Implementation Method 1
acquiring a spectrum of energy transmitted by the object, referred to as measured transmission spectrum, using a spectrometric detector placed for transmission
Implementation Method 2
detecting radiation scattered at a small angle by the object to acquire a spectrum of energy scattered by the object
Implementation Method 3
The expression 'radiation from elastic scattering at a small angle' designates the radiation coherently scattered by the material or object at an angle less than 15°
Implementation Method 4
irradiation of a material or object using a source of electromagnetic radiation, of X or gamma type, followed by the analysis of radiation from elastic scattering at a small angle
Implementation Method 5
a detector, here termed spectrometric detector, configured to establish an energy spectrum of the radiation scattered at a given scattering angle
Data Source
AI summary
A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.