TX Observation ADC Reusing Time-Interleaved RX Calibration
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Solution Overview
Problem
Current Analog-to-Digital Converter (ADC) systems for transmitter observation require significant circuit-level overhead for calibration and operation, including reference voltage generation, clock interface, and digital calibration control, which increases complexity and power dissipation.
Innovation Solution
The proposed ADC system reuses existing infrastructure for RX observation ADC circuits to implement a compact TX observation ADC, sharing clock distribution, reference voltage generation, bias generation, and calibration resources, thereby reducing overhead and power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a dedicated TX observation ADC with full calibration infrastructure is implemented, then measurement precision and reliability are improved, but device complexity and power consumption increase significantly
Solution Approach 1:
The patent applies universality by making the RX ADC circuits perform dual functions: their primary function of receiving and digitizing incoming signals, and a secondary function of serving as TX observation ADCs through signal routing. The same ADC circuits, clock interfaces, reference voltage generators, and calibration infrastructure are reused for both RX and TX observation purposes, eliminating the need for separate dedicated TX ADC hardware while maintaining measurement precision requirements
Solution Approach 2:
The patent merges the TX observation ADC functionality with the existing RX ADC infrastructure. By combining these functions into a single shared hardware resource pool, the patent reduces overall device complexity while maintaining the required measurement capabilities for both transmit and receive paths through time-division or signal-routing multiplexing
2Measurement precision
If a dedicated TX observation ADC with full calibration infrastructure is implemented, then measurement precision is improved, but power dissipation increases
Solution Approach 1:
The patent applies universality by making the RX ADC circuits perform dual functions: their primary function of receiving and digitizing incoming signals, and a secondary function of serving as TX observation ADCs through signal routing. The same ADC circuits, clock interfaces, reference voltage generators, and calibration infrastructure are reused for both RX and TX observation purposes, eliminating the need for separate dedicated TX ADC hardware while maintaining measurement precision requirements
Solution Approach 2:
The patent merges the TX observation ADC functionality with the existing RX ADC infrastructure. By combining these functions into a single shared hardware resource pool, the patent reduces overall device complexity while maintaining the required measurement capabilities for both transmit and receive paths through time-division or signal-routing multiplexing
3Manufacturing precision
If separate calibration infrastructure is provided for TX observation ADC, then manufacturing precision is improved, but device complexity increases
Solution Approach 1:
The patent applies universality by making the RX ADC circuits perform dual functions: their primary function of receiving and digitizing incoming signals, and a secondary function of serving as TX observation ADCs through signal routing. The same ADC circuits, clock interfaces, reference voltage generators, and calibration infrastructure are reused for both RX and TX observation purposes, eliminating the need for separate dedicated TX ADC hardware while maintaining measurement precision requirements
Solution Approach 2:
The patent merges the TX observation ADC functionality with the existing RX ADC infrastructure. By combining these functions into a single shared hardware resource pool, the patent reduces overall device complexity while maintaining the required measurement capabilities for both transmit and receive paths through time-division or signal-routing multiplexing
Data Source
AI summary
An Analog-to-Digital Converter, ADC, system is provided. The ADC system comprises a plurality of ADC circuits and a first input for receiving a transmit signal of a transceiver. One ADC circuit of the plurality of ADC circuits is coupled to the first input and configured to provide first digital data based on the transmit signal. The ADC system further comprises a second input for receiving a receive signal of the transceiver. The other ADC circuits of the plurality of ADC circuits are coupled to the second input, wherein the other ADC circuits of the plurality of ADC circuits are time-interleaved and configured to provide second digital data based on the receive signal. Additionally, the ADC system comprises a first output configured to output digital feedback data based on the first digital data, and a second output configured to output digital receive data based on the second digital data.

