UBG ToF Photodiode Structure for Uniform Multi-Tap Charge Transit

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Solution Overview

Problem

Conventional time-of-flight (ToF) photodiodes face limitations in accuracy due to device non-idealities and sub-optimal design, which affect the correlation between charge collection and distance measurements in depth sensing applications.

Innovation Solution

The implementation of a uniform-bridge-gradient (UBG) ToF photodiode design, featuring a photodiode region with a photodiode-defining implant, shallow and deep bridging implants, and a pinning implant, which creates a uniform doping gradient across multiple taps to enhance photocarrier transit time and minimize charge accumulation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional ToF photodiode design is used, then device simplicity is maintained, but measurement precision deteriorates due to device non-idealities and sub-optimal design

Engineering Contradiction:
Improvedistance measurement accuracyVSAvoidphotodiode structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies local quality by creating a uniform doping gradient specifically in the bridging region between taps, while maintaining other photodiode regions with conventional structures. The bridging implants are strategically placed to provide localized doping control that enhances photocarrier transit without requiring complete redesign of the entire photodiode structure.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the doping parameter by introducing a uniform doping gradient through bridging implants with controlled doping concentrations. This parameter change creates optimized electric field distributions that accelerate photocarrier transit while maintaining overall device functionality and compatibility with standard CMOS fabrication processes.

Inventive Principle:
Principle #35Parameter changes

2Loss of time

If rapid photocarrier transit is achieved through enhanced fields, then shuttle time is reduced, but device complexity increases due to multiple bridging implants

Engineering Contradiction:
Improvephotocarrier shuttle timeVSAvoidimplant structure complexity
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The patent segments the bridging structure into multiple implants at different depths (first bridging implant and second bridging implant). This segmentation allows each implant to contribute to different aspects of the electric field distribution, creating a comprehensive solution for rapid photocarrier transit while maintaining manufacturability through standard ion implantation processes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent extends the solution into the vertical dimension by placing bridging implants at different depths within the photodiode structure. The first bridging implant is positioned at a shallower depth while the second bridging implant is positioned deeper, creating a three-dimensional doping profile that optimizes electric field distribution throughout the photocarrier transit path.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design improves the accuracy of distance measurements by ensuring rapid and equivalent photocarrier transit across all taps, reducing shuttle time and enhancing demodulation efficiency, quantum efficiency, and minimizing temporal readout noise.

Implementation Method 1

The bridging implants provide lateral bridging with a uniform doping gradient near and across the multiple taps

Methodology Applied
Scientific EffectDoping gradient:

Implementation Method 2

The deeper bridging implant can generate an enhanced band of fringing fields near the taps to improve lateral and vertical photocharge transit time

Methodology Applied
Scientific EffectFringing fields: Electric Field

Implementation Method 3

The shallower bridging implant can have a uniform bridging critical dimension that creates a lateral field to improve photocarrier transit time

Methodology Applied
Scientific EffectLateral field: Electric Field

Implementation Method 4

Received photons are converted into photocarriers (i.e., electrons or holes)

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS12191329B2Uniform-bridge-gradient time-of-flight photodiode for image sensor pixel
Publication Date: 2025.01.07 SHENZHEN GOODIX TECH CO LTD
  • US12191329B2 patent drawing
  • US12191329B2 patent drawing
  • US12191329B2 patent drawing

AI summary

A uniform bridge gradient (UBG) time-of-flight (ToF) photodiode block is described, such as for integration with image sensor pixels. The UBG ToF photodiode block can be part of a UBG ToF pixel, and an image sensor can include an array of such pixels. Each UGB ToF photosensor block has multiple taps for selective activation, and a photodiode region designed for complete and rapid transit of photocarriers, as they are generated, via the multiple taps. Embodiments of the photodiode region include a photodiode-defining implant, a relatively shallow first bridging implant, and relatively deep second bridging implant. The bridging implants provide lateral bridging with a uniform doping gradient near and across the multiple taps.