Ultrasonic Analysis Dataset Creation for Defect Evaluation
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Solution Overview
Problem
Ultrasonic testing faces challenges in analyzing combined measurement data sets from different probes and conditions, making it difficult to determine if defects are within permissible sizes due to the complexity of merging individual scans with varying requirements and designs.
Innovation Solution
A method is introduced to create a unified analysis data set by associating equivalent defect sizes from multiple ultrasonic measurements, using normalization and resampling techniques to establish a uniform relationship, allowing for the formation of a maximum defect size that considers various acoustic irradiation directions, polarizations, and probe types, thereby simplifying the analysis and improving defect evaluation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple individual ultrasonic measurements with different probes and conditions are merged, then the detection capability is improved, but the analysis complexity increases
Solution Approach 1:
The patent segments the complex analysis task by processing each ultrasonic measurement independently to determine individual equivalent defect sizes, then combines these segmented results through a maximum operation. This allows multiple measurements with different probes and conditions to be handled separately and then integrated, improving detection capability while keeping the analysis process manageable through systematic segmentation of the evaluation task.
Solution Approach 2:
The patent introduces an intermediary concept of 'equivalent defect size' that serves as a common metric for comparing and combining results from different ultrasonic measurements. This intermediary parameter allows measurements taken with different probes, at different angles, and under different conditions to be unified into a single comparable value, enabling reliable defect assessment without requiring complex integration of heterogeneous data.
2Manufacturing precision
If complete SAFT-analyzed measurement data set is analyzed individually, then the analysis thoroughness is improved, but the time and effort required increases
Solution Approach 1:
The patent extracts the essential defect information from complete SAFT-analyzed measurement data sets by determining equivalent defect sizes for each measurement. Instead of analyzing entire complex data sets individually, the method extracts the critical parameter (equivalent defect size) from each measurement and combines these extracted values, maintaining analysis thoroughness while dramatically reducing the time and effort required.
Solution Approach 2:
The patent changes the parameter being analyzed from complete measurement data sets to a simplified equivalent defect size parameter. This parameter transformation allows the essential defect information to be captured in a single value per measurement, enabling rapid combination of multiple measurements through maximum operations while preserving the thoroughness of individual SAFT analyses.
3Adaptability or versatility
If different aperture sizes are used for each scan, then the adaptability to different scans is improved, but the uniformity of analysis decreases
Solution Approach 1:
The patent applies parameter changes by transforming diverse measurement results (obtained with different aperture sizes, probes, and conditions) into a unified equivalent defect size parameter. This parameter transformation enables measurements with varying apertures and configurations to be expressed in terms of a common metric, restoring uniformity to the analysis while preserving the adaptability to use different scan parameters.
Data Source
AI summary
Various embodiments include methods for creating an analysis data set for an evaluation of an ultrasonic test of an object comprising: providing a first and second measurement data set, each based on an ultrasonic measurement of a region of the object and a SAFT analysis thereof; associating a first equivalent defect size with a volume element of the first measurement data set associated with at least a portion of the region; associating a second equivalent defect size with a volume element of the second measurement data set associated with at least the portion of the region; creating the analysis data set having at least one volume element which is associated with at least the portion of the region; and associating a third equivalent defect size with the volume element of the analysis data set, wherein the third is formed from the maximum of the first and second sizes.