Ultrasonic Array Voltage Sequencing for Nonlinear Defect Opening Sizing
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Solution Overview
Problem
Existing ultrasonic defect detection methods can visualize differences in response intensities but fail to measure the size of defects with non-linear response characteristics, where the response value is not proportional to the amplitude of the transmitted ultrasonic wave.
Innovation Solution
An ultrasonic defect detection apparatus and method using an ultrasonic array probe with voltage application, acquisition, and measurement elements to measure defect opening width by calculating differential response values at varying voltages, dividing ultrasonic elements into groups and applying voltages at different timings.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If ultrasonic waves with different amplitudes are transmitted to visualize difference in response intensities, then defect detection capability is improved, but measurement of defect size (opening width) is not achieved
Solution Approach 1:
The patent applies parameter changes by varying the amplitude of transmitted ultrasonic waves through different voltage levels and measuring the corresponding response intensities. This allows the system to detect non-linear response characteristics and calculate defect opening width based on the relationship between voltage, amplitude, and response intensity, thereby achieving both defect detection and size measurement.
2Reliability
If response intensities are visualized to detect non-linearity, then defect presence is identified, but quantitative measurement of defect dimensions is not obtained
Solution Approach 1:
The patent implements feedback by measuring the response intensity for each transmitted ultrasonic wave amplitude and using this information to calculate the defect opening width. The system feeds back the response intensity data to determine both the presence and quantitative dimensions of the defect, preventing loss of dimensional information.
Solution Approach 2:
By changing the voltage parameter to transmit ultrasonic waves with different amplitudes and measuring the corresponding response intensities, the system extracts both qualitative (defect presence) and quantitative (opening width) information from the same measurement process.
3Measurement precision
If multiple voltage levels are applied to measure differential response values, then defect opening width measurement is achieved, but measurement time and process complexity increase
Solution Approach 1:
The patent applies periodic action by systematically varying the voltage level in a structured sequence (first voltage level, second voltage level, third voltage level) and measuring response intensities at each stage. This periodic voltage application enables calculation of differential response values and defect opening width while maintaining an organized measurement process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables measurement of defect opening width with non-linear response characteristics, providing accurate measurements by analyzing differential response values and threshold voltages to determine defect size.
Implementation Method 1
each of the ultrasonic elements transmitting an ultrasonic wave of a predetermined frequency to an inspection object and receiving the ultrasonic wave of the predetermined frequency reflected by the inspection object
Data Source
AI summary
Provided is an ultrasonic defect detection apparatus (100) including an ultrasonic array probe (10), a voltage application element (20) that executes a voltage application operation including a first operation of simultaneously applying a predetermined voltage to a predetermined number of ultrasonic elements and a second operation of dividing the predetermined number of ultrasonic elements into a plurality of element groups and applying the predetermined voltage to each of the element groups at different timings, an acquisition element (30) that acquires a differential response value, which is a difference between a first response value of ultrasonic waves of a predetermined frequency received by the ultrasonic array probe in the first operation and a second response value obtained by adding a plurality of response values of ultrasonic waves of a predetermined frequency received by the ultrasonic array probe at different timings in the second operation, and a measurement element (40) that measures an opening width of a defect (DF) based on the plurality of differential response values acquired by the acquisition element (30) when the voltage applying unit (20) executes the voltage application operation at a plurality of predetermined voltages having different voltage values.