Ultrasonic Flaw Detection Device Using Segmented Waveform Display

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Solution Overview

Problem

Manual-type ultrasonic flaw detection devices struggle to accurately distinguish defects from noise based solely on ultrasonic echo intensity, placing a significant burden on examiners.

Innovation Solution

An ultrasonic flaw detection device that includes an ultrasonic probe, an imaging device, and a processing unit to divide the inspection area into sections, link waveform data to position information, and allocate sampling data to specific areas, allowing for accurate defect identification by displaying echo intensities mapped onto the inspection area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If only ultrasonic echo intensity is displayed at each position, then the examiner burden is reduced, but the ability to accurately distinguish defects from noise deteriorates

Engineering Contradiction:
Improveexaminer burdenVSAvoiddefect distinction accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The inspection area is divided into multiple divided areas, and waveform data is segmented and associated with each divided area. This allows the examiner to review waveform details for specific regions without being overwhelmed by continuous data, maintaining operational ease while improving defect distinction accuracy through localized waveform analysis.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system adds a spatial dimension to the display by mapping waveform data to divided areas on the inspection target surface. This enables the examiner to correlate echo intensity with specific spatial locations and review waveform characteristics for particular regions, thereby improving defect identification accuracy without increasing overall operational burden.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If waveform data is displayed for the entire inspection area, then defect identification accuracy is improved, but the device complexity increases

Engineering Contradiction:
Improvedefect identification accuracyVSAvoiddata processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system segments waveform data by dividing the inspection area into multiple divided areas and associating waveform data with each divided area. This segmentation reduces data processing complexity by organizing large volumes of waveform data into manageable regional units while maintaining the ability to access and analyze waveform characteristics for accurate defect identification.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system implements local quality by providing detailed waveform data access for specific divided areas rather than requiring uniform detailed display across the entire inspection area. This allows the examiner to access comprehensive waveform information for regions of interest while reducing overall system complexity through selective data presentation.

Inventive Principle:
Principle #3Local quality

3Loss of information

If sampling data is continuously stored in time series, then the ability to review inspection results is improved, but the loss of time for data processing increases

Engineering Contradiction:
Improveinspection result reviewabilityVSAvoiddata processing time
Core Design Contradiction:
Loss of informationVSLoss of time

Solution Approach 1:

The system segments continuously stored sampling data by dividing area information and associating it with corresponding waveform data. This segmentation enables efficient data retrieval and processing by organizing time-series data into spatially-defined units, reducing the time required to process and review inspection results while maintaining complete reviewability of all sampling data.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate differentiation of defects from noise, reducing examiner burden by allowing for detailed review of waveform data and position information, improving defect detection accuracy and efficiency.

Implementation Method 1

an ultrasonic probe that detects waveform data of ultrasonic echoes emitted to an inspection area of an inspection target

Methodology Applied
Scientific EffectUltrasonic wave reflection: Reflection

Data Source

PatentEP3933396B1Ultrasonic flaw detection device
Publication Date: 2024.07.10 IHI CORP
  • EP3933396B1 patent drawingFigure 1
  • EP3933396B1 patent drawingFigure 2
  • EP3933396B1 patent drawingFigure 3

AI summary

An ultrasonic flaw detection device (A), includes: an ultrasonic probe (2) that detects waveform data of ultrasonic echoes emitted to an inspection area of an inspection target; a processing unit (21) that stores pieces of sampling data obtained by sampling the waveform data obtained by the ultrasonic probe at predetermined sampling intervals in a storage unit (23) continuously in time series; and a display control unit (22) that divides the inspection area into a plurality of divided areas and displays each of the plurality of divided areas on a display (11), wherein the processing unit directly or indirectly links a divided area of the plurality of divided areas to one or more waveform data containing sampling data of one or more sampling point included in the divided area.