Ultrasonic Multiple-Reflection Analysis for Shallow CFRP Defects
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Solution Overview
Problem
Composite materials like CFRP face challenges in accurately detecting defects such as peeling and foreign matters in shallow portions due to strong surface reflections and multiple reflections, which obscure the defect signals.
Innovation Solution
A wave motion analysis device and method that extracts and analyzes multiple reflection areas deeper than the inspection target range, using a multiplexer, transmission beamformer, reflection signal acquisition, and detection units to identify defects by processing ultrasonic signals, enabling defect detection despite surface reflections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If ultrasonic scanning is performed on shallow portions of composite materials, then defect detection capability is improved, but surface reflections and multiple reflections obscure defect signals and reduce measurement precision
Solution Approach 1:
The patent segments the ultrasonic signal processing into distinct components: receiving multiple reflection waves, extracting envelope signals, performing Fourier transformation to obtain frequency spectra, and identifying peak frequencies. This segmentation allows separate analysis and processing of different signal components to isolate defect signals from surface reflection interference.
Solution Approach 2:
The patent performs excessive action by receiving and analyzing multiple reflection waves (beyond the single direct reflection) and conducting repeated Fourier transformations on extracted envelope signals. This excessive processing enables differentiation between surface reflections and actual defect signals through frequency domain analysis, ultimately improving defect detection precision in shallow portions.
2Measurement precision
If multiple reflection waves are received and analyzed, then defect detection accuracy is improved, but signal processing complexity increases
Solution Approach 1:
The patent replaces complex time-domain signal processing with frequency-domain analysis using Fourier transformation. By converting time-series reflection wave signals into frequency spectra, the system substitutes mechanical/time-based processing with mathematical/frequency-based processing, simplifying the identification of defect characteristics through peak frequency detection.
Solution Approach 2:
The patent employs periodic action through repeated Fourier transformations on sequentially extracted envelope signals from multiple reflection waves. This periodic processing approach systematically analyzes different reflection components, enabling consistent defect detection while maintaining structured and manageable signal processing complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Accurately detects defects in composite materials by distinguishing multiple reflection signals from surface reflections, enhancing the precision of defect identification in layered structures.
Implementation Method 1
An ultrasonic wave is transmitted from a probe (ultrasonic probe) into an inspection object, a reflection wave of the ultrasonic wave generated from a difference in acoustic impedance in the inspection object structure is received
Implementation Method 2
a reflection wave of the ultrasonic wave generated from a difference in acoustic impedance in the inspection object structure is received
Implementation Method 3
A multiple-reflected wave is received in advance in a defect-free section, and a propagation time is obtained for a reflected wave that is obtained by repeating reflection a plurality of times in the multiple-reflected wave
Data Source
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AI summary
A wave motion analysis device 100 that detects a defect of an inspection object on the basis of a reflection wave obtained from the inspection object, and includes a multiple reflection area extraction unit 106 that acquires tomographic data generated on the basis of the reflection wave and extracts, from the tomographic data, a multiple reflection area corresponding to a depth range deeper than a depth at which a real image of the inspection object is able to be detected and being an area in which a multiple reflection signal is able to be mainly detected, and a detection unit 107 that detects a multiple reflection image corresponding to the defect of the inspection object from the extracted multiple reflection area.