Ultrasonic Phased Array Curved Surface Defect Location
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Solution Overview
Problem
Current ultrasonic phased array technologies lack an effective solution for circumferential scanning of objects with curved surfaces, leading to inaccurate defect location identification due to deviations in visual depictions of defect positions beyond the first leg of the beam during inspection.
Innovation Solution
A system and method utilizing an ultrasonic phased array to provide a volume-corrected view of a sector scan, receiving gate parameters to measure reflection locations, and calculating defect positions independently of the beam leg, enabling accurate defect location determination on objects with curved surfaces.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional ultrasonic phased array scanning is used on curved surfaces, then the inspection can be performed, but the defect location accuracy deteriorates due to visual depiction deviations beyond the first beam leg
Solution Approach 1:
The patent applies parameter changes by modifying how defect locations are calculated and displayed. It introduces a volume-corrected coordinate system that transforms the raw ultrasonic data into accurate spatial positions, accounting for the curved geometry of the inspected object. This corrects the visual depiction deviations that occur in conventional flat-surface scanning methods when applied to curved surfaces.
Solution Approach 2:
The patent introduces an intermediary coordinate transformation system that acts as a mediator between the ultrasonic beam measurements and the final defect location display. This intermediary layer processes the raw data through volume correction calculations, ensuring that defect positions are accurately represented regardless of the beam leg number or curved surface geometry.
2Reliability
If sector scanning is used to map components at appropriate angles, then the probability of detection is optimized, but the device complexity increases due to multiple ultrasonic elements and electronic time delays
Solution Approach 1:
The patent applies universality by designing a phased array system that performs multiple functions: it can steer beams to various angles, focus at different depths, and correct for curved surface geometry all through the same hardware platform. The volume-corrected display system provides a unified interface that handles both flat and curved surface inspections, reducing the need for separate specialized equipment.
3Reliability
If electronic focusing is used to optimize beam shape at expected defect locations, then the probability of detection is improved, but the measurement precision of defect location is affected by the curved surface geometry
Solution Approach 1:
The patent applies local quality by implementing volume correction that is specifically tailored to the local geometry of the curved surface being inspected. The system adjusts the coordinate transformation and display parameters based on the specific radius and curvature of the object surface, ensuring that defect locations are accurately represented for each local region rather than using a uniform correction approach.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate display and calculation of defect locations on curved surfaces, independent of the beam leg number, thereby improving the precision of defect identification in ultrasonic inspections.
Implementation Method 1
phased arrays use multiple ultrasonic elements and electronic time delays to create beams via constructive and destructive interference
Implementation Method 2
phased arrays use multiple ultrasonic elements and electronic time delays to create beams via constructive and destructive interference
Implementation Method 3
receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect
Data Source
AI summary
A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.