Ultrasonic Damage Evaluation via Scattering Degree Analysis
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Solution Overview
Problem
Conventional damage evaluation methods using phased array ultrasonic flaw detection devices face challenges in achieving high accuracy due to sensitivity variations and contact state issues during measurement.
Innovation Solution
A damage evaluation device and method that employs a phased array probe to irradiate ultrasonic signals into a metal, detect reflection signals, and calculate scattering degrees of pixel data from segmented planes to evaluate damage with high accuracy, using an arithmetic processor to quantify and analyze the reflection signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional phased array ultrasonic flaw detection is used to evaluate damage inside metal, then damage detection capability is provided, but measurement accuracy deteriorates due to sensitivity variations and contact state issues
Solution Approach 1:
The patent changes the evaluation parameter from direct reflection signal intensity to scattering degree calculated from pixel data. This parameter transformation eliminates the influence of sensitivity variations and contact state issues, as scattering degree is a normalized metric that reflects material microstructure changes rather than absolute signal strength, thereby resolving the contradiction between measurement precision and reliability
Solution Approach 2:
The patent introduces pixel data as an intermediary between the raw reflection signal and the final damage evaluation. By quantizing reflection signals into pixel data and then calculating scattering degree from these pixels, the system creates a buffered evaluation pathway that filters out measurement variations, improving both accuracy and reliability
2Measurement precision
If detailed reflection signal analysis is performed to improve damage evaluation accuracy, then measurement precision improves, but calculation complexity increases
Solution Approach 1:
The patent segments the inspection region into multiple planes and further divides each plane into pixels, then calculates scattering degree based on the distribution of these pixel data. This segmentation approach provides detailed analysis for high accuracy while maintaining manageable calculation complexity through systematic organization of the calculation process
Solution Approach 2:
The patent replaces complex mechanical analysis methods with statistical calculation of scattering degree from pixel data. Instead of using elaborate mechanical models to interpret ultrasonic signals, the system uses straightforward statistical measures (scattering degree) that are computationally efficient while providing accurate damage evaluation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise evaluation of damage inside metals by calculating scattering degrees from pixel data, improving accuracy and reducing calculation complexity, and providing a reliable service-life consumption rate assessment.
Implementation Method 1
a phased array probe configured to irradiate an ultrasonic signal from a surface of an inspection metal, which is a metal to be evaluated, toward an inside of the inspection metal and detect a reflection signal reflected in a predetermined region inside the inspection metal
Data Source
AI summary
A damage evaluation device includes: a phased array probe that irradiates an ultrasonic signal from a surface of an inspection metal toward an inside of the inspection metal and detects a reflection signal reflected in a predetermined region inside the inspection metal; and an arithmetic processor. The arithmetic processor sets planes parallel to each other in an inspection region, calculates pixel data by quantifying the reflection signal from segments set in each of the planes; calculates a scattering degree of the pixel data, and evaluates damage of the inspection metal based on the scattering degree.