Ultrasonic Testing Device With Oxide Semiconductor Memory
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Solution Overview
Problem
Current ultrasonic flaw detection devices are costly to manufacture and have complex structures, limiting their accuracy and usability in non-destructive testing applications.
Innovation Solution
A testing device comprising a sending unit, a receiving unit, a control unit, and a display, utilizing a memory portion with oxide semiconductor transistors for analog data storage and an arithmetic portion for image signal generation, allowing for simplified structure and enhanced accuracy in ultrasonic wave analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If conventional ultrasonic flaw detection devices are used, then testing functionality is provided, but manufacturing cost is high and device structure is complex
Solution Approach 1:
The patent combines the sending unit and receiving unit into a single probe device, and integrates the control unit with memory and arithmetic portions into one consolidated unit. This merging reduces the number of separate components and simplifies the overall device structure, directly addressing the contradiction between manufacturing cost and device complexity.
Solution Approach 2:
The control unit is designed to perform multiple functions including signal processing, data storage in memory, image generation through arithmetic operations, and display control. This multi-functional integration eliminates the need for separate dedicated components for each function, reducing device complexity and manufacturing cost while maintaining full testing functionality.
2Measurement precision
If conventional ultrasonic flaw detection devices are used, then basic testing is possible, but testing accuracy is limited
Solution Approach 1:
The patent replaces traditional mechanical signal processing methods with electronic and computational approaches. The control unit uses digital signal processing, memory for data storage, and arithmetic portions for image generation, substituting complex mechanical analog systems with more precise electronic systems that improve testing accuracy without proportionally increasing device complexity.
Solution Approach 2:
The invention implements dynamic pulse repetition frequency change through the control unit, allowing optimization of testing parameters for different inspection scenarios. This parameter flexibility enables higher testing accuracy by adapting to specific inspection requirements while using a unified control structure that doesn't significantly increase device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution reduces manufacturing costs, simplifies the device structure, and enhances testing accuracy by using oxide semiconductor technology for efficient data processing and storage, making it suitable for non-destructive testing of large structures like buildings and tunnels.
Implementation Method 1
a probe 40 including a piezoelectric element 41
Implementation Method 2
the arriving time of the reflected wave at a flaw portion is different from that of the reflected wave at a non-flaw portion
Data Source
AI summary
A cost of a testing device is reduced. A structure of a testing device is simplified. A testing device capable of testing with higher accuracy is provided. A testing device (10) has a structure including a sending unit (13), a receiving unit (14), a control unit (11), and a display (15). The control unit includes a memory portion (21) and an arithmetic portion (22). The sending unit has a function of generating a pulse signal for a probe (40) to generate an ultrasonic wave (51). The receiving unit has a function of generating a first signal including a first analog data (D1) on the basis of the input single input from the probe. The memory portion has a function of storing the first analog data. The arithmetic portion has a function of generating an image signal (S0) output to the display on the basis of the first analog data stored in the memory portion. The display has a function of displaying an image based on the image signal.