Underfill Dispensing Control for 3D IC Packaging

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Solution Overview

Problem

In three-dimensional integrated circuit (3D IC) packaging, existing methods face challenges in accurately dispensing underfill material between dies to prevent voids and bridging, while ensuring optimal fillet formation, which affects the reliability and yield of semiconductor devices.

Innovation Solution

An automatic measurement system and dispensing apparatus that uses a camera and processor to monitor and control the dispensing of underfill material, ensuring the formation of precise fillets by adjusting the amount dispensed based on real-time image analysis to prevent voids and bridging between closely-spaced dies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If manual dispensing methods are used for underfill material, then device complexity is reduced, but manufacturing precision and reliability deteriorate due to inaccurate control of material amount

Engineering Contradiction:
Improveprecision of underfill material dispensingVSAvoidcomplexity of dispensing system
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent implements an automatic measurement system that captures images of the underfill material during dispensing, measures the fillet width in real-time, and provides feedback control to adjust the dispensing amount. This feedback mechanism ensures precise control of underfill material dispensing while maintaining manufacturing precision, directly resolving the contradiction between precision and system complexity.

Inventive Principle:
Principle #23Feedback

2Reliability

If increased amount of underfill material is dispensed, then voids between dies are prevented, but bridging between closely-spaced dies occurs

Engineering Contradiction:
Improvereliability of die bondingVSAvoidbridging between dies
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The automatic measurement system monitors the fillet width of dispensed underfill material in real-time and provides feedback control to stop dispensing at the optimal point. This prevents both voids (by ensuring sufficient material) and bridging (by preventing excessive material), thereby resolving the contradiction between reliability and harmful effects.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system dispenses underfill material in controlled amounts, using partial action rather than excessive dispensing. By measuring and controlling the fillet width, the system achieves the minimum necessary material amount to prevent voids without causing bridging, effectively resolving the contradiction through precise dosage control.

Inventive Principle:
Principle #16Partial or excessive action

3Manufacturing precision

If real-time image analysis is implemented, then manufacturing precision of fillet formation is improved, but use of energy and device complexity increase

Engineering Contradiction:
Improveprecision of fillet formationVSAvoidenergy consumption of measurement system
Core Design Contradiction:
Manufacturing precisionVSUse of energy by moving object

Solution Approach 1:

The system uses real-time image analysis to measure fillet width during dispensing and provides feedback control to achieve precise fillet formation. This feedback mechanism ensures high manufacturing precision while minimizing energy consumption by operating only during the critical dispensing phase, resolving the contradiction between precision and energy use.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS9390060B2Packaging methods, material dispensing methods and apparatuses, and automated measurement systems
Publication Date: 2016.07.12 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US9390060B2 patent drawing
  • US9390060B2 patent drawing
  • US9390060B2 patent drawing

AI summary

Packaging methods, material dispensing methods and apparatuses, and automatic measurement systems are disclosed. In one embodiment, a method of packaging semiconductor devices includes coupling a second die to a top surface of a first die, dispensing a first amount of underfill material between the first die and the second die, and capturing an image of the underfill material. Based on the image captured, a second amount or no additional amount of underfill material is dispensed between the first die and the second die.