Unequal Bit Reliability Storage for LDPC Decoders

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Solution Overview

Problem

Modern digital communication and storage systems inefficiently use the same type of storage units for all bits, leading to excessive area and power consumption, particularly in systems like low-density parity-check (LDPC) decoders, where more than half the chip area is occupied by storage memory.

Innovation Solution

Implementing an unequal bit-reliability information storage method that uses multiple memories with different reliabilities, where the most significant bits are stored in a high-reliability memory and the least significant bits in a lower-reliability memory, with varying operating conditions to reduce area and power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If the same type of storage unit is used for all bits, then the system is simple to implement, but the area and power consumption are excessive

Engineering Contradiction:
Improvesimplicity of implementationVSAvoidstorage memory area
Core Design Contradiction:
Ease of manufactureVSArea of stationary object

Solution Approach 1:

The storage memory is segmented into multiple types (first storage units and second storage units) with different reliability characteristics. Most significant bits are stored in first storage units while least significant bits are stored in second storage units, allowing the system to use different storage technologies for different portions of the data.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different storage units are assigned different quality levels (reliability characteristics) based on the significance of the bits they store. High-reliability first storage units are used for critical most significant bits, while lower-reliability second storage units are used for less critical least significant bits, optimizing both area and reliability.

Inventive Principle:
Principle #3Local quality

2Device complexity

If the same type of storage unit is used for all bits, then the system architecture is uniform, but the power consumption is excessive

Engineering Contradiction:
Improvestorage system uniformityVSAvoidstorage memory power consumption
Core Design Contradiction:
Device complexityVSUse of energy by stationary object

Solution Approach 1:

The storage memory is segmented into multiple types (first storage units and second storage units) with different reliability characteristics. Most significant bits are stored in first storage units while least significant bits are stored in second storage units, allowing the system to use different storage technologies for different portions of the data.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different storage units are assigned different quality levels (reliability characteristics) based on the significance of the bits they store. High-reliability first storage units are used for critical most significant bits, while lower-reliability second storage units are used for less critical least significant bits, optimizing both area and reliability.

Inventive Principle:
Principle #3Local quality

3Reliability

If high-reliability storage is used for all bits, then the decoding performance is optimized, but the area and cost increase significantly

Engineering Contradiction:
Improvedecoding performanceVSAvoidstorage memory area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The storage memory is segmented into multiple types (first storage units and second storage units) with different reliability characteristics. Most significant bits are stored in first storage units while least significant bits are stored in second storage units, allowing the system to use different storage technologies for different portions of the data.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different storage units are assigned different quality levels (reliability characteristics) based on the significance of the bits they store. High-reliability first storage units are used for critical most significant bits, while lower-reliability second storage units are used for less critical least significant bits, optimizing both area and reliability.

Inventive Principle:
Principle #3Local quality

4Reliability

If high-reliability storage is used for all bits, then the error performance is improved, but the production cost increases

Engineering Contradiction:
Improveerror performanceVSAvoidproduction cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The storage memory is segmented into multiple types (first storage units and second storage units) with different reliability characteristics. Most significant bits are stored in first storage units while least significant bits are stored in second storage units, allowing the system to use different storage technologies for different portions of the data.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different storage units are assigned different quality levels (reliability characteristics) based on the significance of the bits they store. High-reliability first storage units are used for critical most significant bits, while lower-reliability second storage units are used for less critical least significant bits, optimizing both area and reliability.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS9058880B2Unequal bit reliability information storage method for communication and storage systems
Publication Date: 2015.06.16 NATIONAL TSING HUA UNIVERSITY
  • US9058880B2 patent drawing
  • US9058880B2 patent drawing
  • US9058880B2 patent drawing

AI summary

An unequal bit-reliability information storage method for communication and storage systems at least includes one storage unit having a first memory and a second memory; the most significant information bits are stored in the first memory; and least significant information bits are stored in the second memory. Based on the significance of each bit of the information with the use of the first or second memories of different reliability for storage, the complexity of the storage unit, the production cost and the power consumption can be reduced while maintaining the performance.