Unequal-Offset Reference Lines for VVC Intra Prediction

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Solution Overview

Problem

The existing Multiple Reference Line (MRL) intra prediction in VVC and ECM is inefficient, particularly for positive angular prediction directions, due to the constraint of equal offsets for reference lines, which limits the effectiveness of position-dependent prediction combination (PDPC) operation.

Innovation Solution

Implementing unequal offset reference lines in MRL and template-based MRL (TMRL) intra prediction, allowing for more combinations of reference samples by signaling the best pair of top and left reference arrays using a suitable encoding scheme.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If equal offset reference lines are used in MRL intra prediction, then the reference line structure is simple and easy to implement, but the prediction accuracy is limited particularly for positive angular prediction directions

Engineering Contradiction:
Improveprediction accuracyVSAvoidreference line structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies asymmetry by allowing the top reference array and left reference array to have different offset distances from the target block. Specifically, the top reference array can be at offset M while the left reference array is at offset N, where M ≠ N. This asymmetric configuration enables better adaptation to positive angular prediction directions by providing reference samples at optimally positioned locations, thereby improving prediction accuracy without requiring a completely new reference line structure

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The patent implements local quality by selectively applying different offset configurations to different parts of the reference structure. The top and left reference arrays can have different offsets depending on the prediction direction and block characteristics. This allows the reference line structure to be locally optimized for specific prediction scenarios (particularly positive angular modes) while maintaining the general MRL framework, thus improving prediction accuracy without globally increasing complexity

Inventive Principle:
Principle #3Local quality

2Measurement precision

If unequal offset reference lines are implemented to improve prediction accuracy, then more combinations of reference samples become available, but the encoding complexity and computational load increase

Engineering Contradiction:
Improveprediction accuracyVSAvoidencoding complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by modifying the offset parameters of the reference arrays. Instead of fixed equal offsets, the system allows the top reference array offset (M) and left reference array offset (N) to be independently configurable parameters. This enables the encoder to select optimal offset values based on prediction direction and block characteristics, improving prediction accuracy while managing complexity through parameter optimization rather than structural overhaul

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements dynamics by making the reference array offsets adaptive rather than static. The offset values M and N can be dynamically selected based on the prediction mode, block size, and other coding parameters. This dynamic configuration allows the system to achieve better prediction accuracy for positive angular modes when needed, while falling back to simpler configurations for other cases, thus balancing accuracy improvement with encoding complexity

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If unequal offsets are used for top and left reference arrays, then rate-distortion performance is improved, but the number of possible reference sample combinations increases significantly

Engineering Contradiction:
Improverate-distortion performanceVSAvoidnumber of reference sample combinations
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The patent applies parameter changes by optimizing specific offset parameters (M and N) to achieve the best rate-distortion performance. Rather than allowing all possible offset combinations, the system identifies and uses specific parameter configurations that provide the best trade-off between prediction accuracy and bitrate. This parameter optimization approach improves rate-distortion performance while controlling the number of reference sample combinations through selective parameter usage

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentEP4676036A1Unequal offset multiple reference line (MRL) for intra prediction
Publication Date: 2026.01.07 INTERDIGITAL CE PATENT HOLDINGS SAS
  • EP4676036A1 patent drawingFigure 1
  • EP4676036A1 patent drawingFigure 2
  • EP4676036A1 patent drawingFigure 3

AI summary

Systems and methods for improved MRL and TMRL intra prediction, and particularly, the use of unequal offset reference lines in MRL and TMRL to improve intra prediction. In some implementations, the top reference arrays and left reference arrays may have unequal offsets from a target block. Because the top and left reference arrays can have different offsets, there are many more possible combinations for reference samples. The best pair of top and left reference arrays may be signaled with a suitable encoding scheme.