Uneven DBR Reflective Layer for Dicing Crack Control in LEDs

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Solution Overview

Problem

Conventional light-emitting devices face issues with light absorption and reliability due to cracks in the reflective layer during the dicing process, which can lead to moisture penetration and reduced device reliability.

Innovation Solution

A light-emitting device design featuring a substrate with a dicing street and an uneven reflective layer with a Distributed Bragg Reflector structure, where the reflective layer has an uneven thickness adjacent to the substrate sidewall, and a cap layer formed by chemical vapor deposition to enhance film quality and prevent cracking.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional reflective layer is used during dicing process, then the device structure is simple, but cracks occur in the reflective layer leading to moisture penetration and reduced reliability

Engineering Contradiction:
Improvedevice reliabilityVSAvoidreflective layer structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The reflective layer is divided into a first reflective layer and a second reflective layer with different functions. The first reflective layer provides optical reflection, while the second reflective layer serves as a protective barrier against moisture penetration through cracks. This segmentation allows each layer to be optimized for its specific function, improving overall device reliability without excessive complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent uses a composite structure combining multiple reflective layers with different material properties. The first reflective layer (e.g., metal-based) provides high reflectivity, while the second reflective layer (e.g., dielectric-based) provides crack resistance and moisture barrier properties. This composite approach resolves the contradiction by integrating multiple functions into a unified structure that maintains reliability while managing complexity.

Inventive Principle:
Principle #40Composite materials

2Reliability

If the reflective layer is made thicker to prevent cracks, then reliability improves, but light extraction efficiency decreases due to increased absorption

Engineering Contradiction:
Improvecrack resistanceVSAvoidlight absorption
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The reflective layer is segmented into two distinct layers with different thicknesses and material compositions. The first reflective layer is optimized for light reflection with appropriate thickness for optical performance, while the second reflective layer is specifically designed as a thin protective barrier that prevents crack propagation and moisture penetration without significantly increasing light absorption. This segmentation allows independent optimization of each layer's thickness for its specific function.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the reflective layer structure are assigned different qualities and thicknesses. The first reflective layer has properties optimized for optical reflection, while the second reflective layer has properties optimized for mechanical protection and moisture barrier functions. This local differentiation allows the structure to achieve both high reliability and low light absorption by placing the right material properties in the right locations.

Inventive Principle:
Principle #3Local quality

3Reliability

If a uniform reflective layer is used, then manufacturing is simpler, but cracks occur at the sidewall region during dicing process

Engineering Contradiction:
Improvecrack preventionVSAvoidfilm coating process
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The reflective layer structure implements local quality by having different layer configurations in different regions. The first reflective layer provides base reflection, while the second reflective layer is specifically positioned to protect the sidewall region and dicing street areas where cracks are most likely to occur. This localized protection approach prevents cracks at critical regions without requiring complex manufacturing processes across the entire device.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The second reflective layer is applied in advance as a protective barrier before the dicing process. This preliminary protective layer prevents crack formation and propagation during subsequent manufacturing steps, addressing the reliability issue before it can manifest. The preliminary action of adding this protective layer simplifies the overall manufacturing process by preventing defects rather than requiring complex repair or rework steps.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The design improves light extraction efficiency and reduces the risk of moisture penetration, enhancing the reliability and performance of the light-emitting device by minimizing cracks and ensuring better film coating characteristics.

Implementation Method 1

a reflective layer comprising a Distributed Bragg Reflector structure covering the protective layer

Methodology Applied
Scientific EffectDistributed Bragg Reflector: Bragg Diffraction

Implementation Method 2

a cap layer covering the reflective layer, wherein the reflective layer comprises an uneven portion adjacent to the sidewall of the substrate

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Data Source

PatentUS11757077B2Light-emitting device
Publication Date: 2023.09.12 ENNOSTAR CORP
  • US11757077B2 patent drawing
  • US11757077B2 patent drawing
  • US11757077B2 patent drawing

AI summary

A light-emitting device comprises a substrate comprising a top surface and a sidewall; a semiconductor stack formed on the top surface of the substrate comprising a first semiconductor layer, an active layer and a second semiconductor layer; a dicing street surrounding the semiconductor stack and exposing the top surface of the substrate; a protective layer covering the semiconductor stack and the dicing street; a reflective layer comprising a Distributed Bragg Reflector structure and covering the protective layer; and a cap layer covering the reflective layer, wherein the reflective layer comprises an uneven portion adjacent to the sidewall of the substrate, and the uneven portion comprises an uneven thickness.