Universal Display Light-On Test Device for Mobile Phones
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The existing display light-on test methods require a corresponding test jig for each type of connector, leading to increased costs and waste due to the need for multiple connectors and test jigs, as well as labor and time inefficiencies in testing different types of mobile phone connectors.
Innovation Solution
A display light-on test device with an integrated connector and a field programmable gate array chip that can perform light-on tests on multiple display modules simultaneously, using D-type connectors to connect and transmit signals, and a sampling processor to sample and quantify power signals, allowing for automatic testing of voltage, current, and processor interface decoding, with the ability to adapt to different connector types by replacing only the integrated connector.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a corresponding test jig is made for each type of connector, then the testing function is realized, but the cost increases significantly
Solution Approach 1:
The patent designs a universal test jig with a standardized connector interface that can accommodate multiple types of mobile phone connectors through a single replaceable adapter module. This multi-functional design allows the same base test jig to perform testing functions across different connector types (e.g., Lightning, USB-C, Micro-USB) without requiring separate test jigs for each type, thereby reducing cost while maintaining testing reliability.
2Reliability
If a corresponding test jig is made for each type of connector, then the testing function is realized, but the labor and time are wasted
Solution Approach 1:
The test jig is segmented into a permanent base unit and interchangeable adapter modules. Each adapter module is designed to match specific connector types. When testing different mobile phone types, only the adapter module needs to be replaced, not the entire test jig. This segmentation significantly reduces the time and labor required for setup and configuration, allowing for rapid switching between different testing scenarios.
Solution Approach 2:
The test jig incorporates dynamic configurability through the interchangeable adapter module system. The system can adapt its physical interface to match different connector specifications dynamically by simply changing the adapter module, eliminating the need for manual adjustment or reconfiguration of the entire test jig for each connector type.
3Adaptability or versatility
If multiple connectors and test jigs are used, then different connector types can be tested, but material costs are wasted
Solution Approach 1:
The base test jig is designed with universal compatibility, featuring a standardized receptacle that accepts various adapter modules for different connector types. This universality eliminates the need to manufacture and dispose of multiple complete test jigs, reducing material waste while maintaining the ability to test all connector types required for different mobile phone models.
Solution Approach 2:
Instead of discarding entire test jigs when moving to a different connector type, the design allows recovery and reuse of the base test jig unit. Only the lightweight adapter module is replaced, minimizing material consumption and reducing the overall cost of producing multiple test jigs for different applications.
Data Source
AI summary
In an embodiment, the display light-on test device includes: a plurality of D-type connectors configured to be correspondingly connected to mobile phones with different connector types, and receive and transmit power signals; a sampling processor configured to receive the power signals, sample and quantize the power signals into digital data and/or image data, and output the data to a field programmable gate array chip, receive commands, and output, according to the commands, corresponding micro control commands; the field programmable gate array chip connected to the D-type connectors and the sampling processor, and configured to receive the data and the micro control commands, generate corresponding micro control parameters, and process, according to the micro control parameters, the data, to output data required to perform the light-on tests to the display modules to be tested, so that the light-on tests are performed on the display modules to be tested.