Universal Electrical Interconnect Testing System
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Solution Overview
Problem
Conventional testing systems are unable to efficiently test multiple electrical interconnects simultaneously and require dedicated machines for each type, occupying valuable cleanroom space and being costly to maintain.
Innovation Solution
A compact testing system with a modular design featuring a bottom plate, frame member, socket plate, and removable device under test (DUT) PCB, allowing quick conversion between configurations and accommodating various semiconductor chips, utilizing a gantry and actuator for precise testing of contact points.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a dedicated testing machine is provided for each type of electrical interconnect, then testing accuracy and reliability are improved, but cleanroom space consumption and equipment cost increase
Solution Approach 1:
The testing system incorporates a universal testing platform that can accommodate multiple types of electrical interconnects through a single machine design, eliminating the need for dedicated testing machines for each interconnect type while maintaining testing reliability
Solution Approach 2:
The system uses dynamically adjustable testing components including movable clamps, adjustable positioning mechanisms, and reconfigurable test fixtures that can be quickly modified to match different interconnect configurations, allowing one machine to serve multiple testing functions
2Reliability
If multiple dedicated testing machines are maintained for different semiconductor chip types, then each chip type can be tested optimally, but equipment cost and maintenance burden increase
Solution Approach 1:
A single universal testing machine is designed to handle multiple semiconductor chip types through configurable test fixtures and adjustable parameters, replacing the need for maintaining a fleet of dedicated machines for different chip types
Solution Approach 2:
The testing system utilizes programmable control that allows adjustment of testing parameters such as force, position, and electrical characteristics to match different chip requirements, enabling one machine to optimally test various chip types by changing operational parameters rather than requiring different hardware
3Ease of manufacture
If conventional testing systems are used for multiple electrical interconnect types, then existing equipment can be utilized, but conversion between configurations is difficult and time-consuming
Solution Approach 1:
The testing system incorporates dynamically adjustable components including quick-change clamps, movable test fixtures, and reconfigurable positioning mechanisms that can be rapidly modified to accommodate different interconnect types, significantly reducing conversion time compared to conventional fixed configurations
Solution Approach 2:
The testing apparatus is divided into modular, independently adjustable segments including separate clamping mechanisms, positioning units, and test fixtures that can be individually configured and repositioned to match different interconnect requirements without affecting the entire system
4Area of stationary object
If a single compact testing system is designed to test multiple electrical interconnects, then cleanroom space and equipment cost are reduced, but system complexity increases
Solution Approach 1:
A single compact testing system is designed with universal capabilities to accommodate multiple electrical interconnect types through integrated adjustable mechanisms, consolidating what would traditionally require multiple separate machines into one space-efficient unit while managing complexity through standardized interfaces
Data Source
AI summary
A testing system for electrical interconnects having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. An actuator is also presented that presses the device under test into the electrical interconnect at increments where tests are performed on one, some or all of the contact points of the electrical interconnect. This information is then analyzed and graphed to assist with determine the optimum force and/or height to use during actual use.