Universal Interface Channel Circuit for Automated Test Systems
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Solution Overview
Problem
Conventional automated testing systems for electronic circuits are costly, complex, and require numerous components and cables due to the need for multiple data acquisition circuits and relay multiplexer/scanner cards, making them inefficient for testing a wide variety of devices without requiring wiring changes.
Innovation Solution
A universal interface channel circuit system that includes a data acquisition circuit coupled to channel circuit boards with multiple universal interface channel circuits, each capable of providing various test signals without wiring changes, reducing the need for multiple data acquisition circuits and eliminating the requirement for separate mux/scanner boards.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple data acquisition circuits and relay multiplexer/scanner cards are used to test a wide variety of electronic circuits, then the testing capability and versatility are improved, but the system cost, size, and complexity increase significantly
Solution Approach 1:
The patent implements a universal channel interface circuit that can perform multiple testing functions (analog input, digital input, waveform output, etc.) through a single standardized interface. The circuit includes multiplexers and mode control logic that dynamically configure the interface for different test types, eliminating the need for separate dedicated circuits for each test function while maintaining full testing capability across various electronic circuits
Solution Approach 2:
The patent combines multiple previously separate data acquisition circuits and relay multiplexer/scanner cards into a single integrated universal channel interface circuit. By merging these functions into one standardized interface with internal multiplexing and mode control, the system achieves the same versatility with reduced component count, lower cost, and decreased complexity
2Adaptability or versatility
If multiple data acquisition circuits and relay multiplexer/scanner cards are used to cover various test functions, then the functional capability is improved, but the number of components and cables increases leading to larger system size
Solution Approach 1:
The universal channel interface circuit provides multiple test functions (analog input, digital input, waveform output, counter/timer, etc.) within a single standardized interface design. This multi-functional approach eliminates the need for separate physical circuits for each test type, thereby reducing the overall system footprint while maintaining comprehensive functional capability
Solution Approach 2:
The patent merges multiple separate data acquisition circuits and relay multiplexer cards into one integrated universal interface circuit. This consolidation reduces the number of individual components and their associated cables, directly decreasing the system's physical size and layout requirements
3Adaptability or versatility
If multiple data acquisition circuits are used to test different signal types, then the testing versatility is improved, but the system cost increases due to increased component count
Solution Approach 1:
The universal channel interface circuit is designed to handle multiple signal types (analog, digital, waveform) and test functions through a single standardized interface. The internal multiplexers and mode control logic dynamically route and process different signal types, eliminating the need for separate dedicated circuits for each signal type and thereby reducing the total component count while maintaining full testing versatility
4Adaptability or versatility
If relay multiplexer/scanner cards are used to provide programmable channel interface connections, then the channel flexibility is improved, but the device complexity and cable requirements increase
Solution Approach 1:
The universal channel interface circuit provides programmable channel connections and flexible routing through integrated multiplexers and mode control logic within a single standardized interface. This internal integration eliminates the need for separate relay multiplexer/scanner cards and their associated complex wiring, achieving the same channel flexibility with reduced circuit design complexity
Data Source
AI summary
A test circuit and system for testing one or more electrical properties of an electronic circuit or other device under test (DUT) by applying and monitoring test signals to the DUT is disclosed. The test circuit can utilize a plurality of universal interface channel circuits in a single automated test system to provide a unique and flexible approach for testing electronic circuits or devices that has many advantages. A single data acquisition circuit can coupled to one or more universal interface channel circuits. Each of the universal interface channel circuits can be independently commanded by the data acquisition circuit to provide one of a variety of test signals to a DUT as desired.