Universal Probe Card GCD Pitch Configuration
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Solution Overview
Problem
Conventional probe cards are typically dedicated to specific electronic elements and cannot adapt to changes in size or pitch, leading to increased testing costs and lower efficiency when dealing with elements of varying sizes or pitches.
Innovation Solution
A universal probe card with probes arranged at a pitch that is the greatest common factor of the pitches between different patterns, allowing it to contact and test multiple elements with varying pitches, and a probe holder with accommodating holes configured to accommodate these probes for flexible testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a dedicated probe card is designed for specific electronic elements, then testing precision is improved, but adaptability deteriorates
Solution Approach 1:
The probe card is designed with a universal structure where the probe holder can accommodate multiple probe types and configurations. The probe holder includes various positioning holes and mounting structures that allow different probe arrangements to be used on the same probe card, enabling it to test multiple types of electronic elements with different pitches and patterns without requiring dedicated probe cards for each element type.
2Productivity
If the number of probes on the probe card is increased to test more elements, then productivity is improved, but device complexity deteriorates
Solution Approach 1:
The probe card structure is segmented into modular components, with the probe holder being a separate module that can be independently configured. This segmentation allows the system to handle multiple elements efficiently while maintaining manageable complexity through modular design, where the probe holder module can be adjusted without redesigning the entire probe card.
3Ease of manufacture
If conventional probe cards are used for elements with varying sizes and pitches, then manufacturing cost is reduced, but adaptability deteriorates
Solution Approach 1:
The probe card incorporates dynamic configurability through its probe holder design, which allows the probe arrangement to be adjusted or reconfigured based on the specific testing requirements. This dynamic capability enables a single probe card design to adapt to different element sizes and pitches, eliminating the need to manufacture multiple dedicated probe cards while maintaining full adaptability.
Data Source
AI summary
An universal probe card and a testing method are disclosed. The universal probe card includes a plurality of probes. The probes are configured to contact and test a plurality of different patterns to be tested. Each of the plurality of different patterns to be tested includes a plurality of portions to be tested. A pitch between the plurality of probes is a greatest common factor of pitches between the plurality of portions to be tested in the plurality of different patterns to be tested.