Universal Probe Card PCB Design for Multi-DUT Testing

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Solution Overview

Problem

The existing IC testing systems require a different probe card for each specific IC design, leading to significant time and cost expenditures on designing and manufacturing various probe cards for different devices under test (DUTs).

Innovation Solution

A printed circuit board (PCB) probe card design that includes a membrane core with signal traces and needle pins, allowing for selective transmission of testing signals via different sets of signal channels, enabling the same probe card to be used for probing DUTs with different designs by varying the signal channels used.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a different probe card is designed for each specific IC design, then the testing functionality for different DUTs is ensured, but the time and cost for designing and manufacturing various probe cards increases significantly

Engineering Contradiction:
Improvetesting functionalityVSAvoiddesign and manufacturing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The probe card is designed with a universal structure that can accommodate multiple DUT types. The PCB includes multiple sets of signal channels and contact points that can be selectively activated depending on the DUT being tested. This allows a single probe card design to serve multiple functions for different IC designs, eliminating the need to design separate probe cards for each DUT type.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The probe card incorporates dynamic configurability through selectable signal channels and contact points. The system can dynamically reconfigure which signal channels are active based on the specific DUT being tested. This dynamic adaptation allows the same physical probe card to functionally adapt to different IC designs without physical redesign.

Inventive Principle:
Principle #15Dynamics

2Reliability

If a different probe card is designed for each specific IC design, then the testing functionality for different DUTs is ensured, but the cost for designing and manufacturing various probe cards increases significantly

Engineering Contradiction:
Improvetesting functionalityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The probe card is designed with a universal structure that can accommodate multiple DUT types. The PCB includes multiple sets of signal channels and contact points that can be selectively activated depending on the DUT being tested. This allows a single probe card design to serve multiple functions for different IC designs, eliminating the need to design separate probe cards for each DUT type.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of manufacture

If a universal probe card design is used for different DUTs, then the design and manufacturing cost is reduced, but the complexity of configuring different signal channels increases

Engineering Contradiction:
Improvedesign and manufacturing costVSAvoidsignal channel configuration
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The probe card PCB is segmented into multiple independent signal channels and contact point sets. Each segment can be independently configured and activated based on the specific DUT requirements. This segmentation allows the complex universal design to be managed through modular activation rather than requiring complex wiring or switching mechanisms throughout the entire probe card.

Inventive Principle:
Principle #1Segmentation

4Reliability

If multiple probe cards are maintained for different IC designs, then specific testing requirements are met, but the inventory management and resource utilization efficiency decreases

Engineering Contradiction:
Improvetesting requirement fulfillmentVSAvoidresource utilization efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The probe card is designed with a universal structure that can accommodate multiple DUT types. The PCB includes multiple sets of signal channels and contact points that can be selectively activated depending on the DUT being tested. This allows a single probe card design to serve multiple functions for different IC designs, eliminating the need to design separate probe cards for each DUT type.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS9372205B2Universal probe card PCB design
Publication Date: 2016.06.21 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US9372205B2 patent drawing
  • US9372205B2 patent drawing
  • US9372205B2 patent drawing

AI summary

A printed circuit board (PCB) is disclosed. The PCB includes a plurality of first signal pads, a plurality of signal channels, and a plurality of second signal pads. The first signal pads are adjacently disposed to define an opening. At least one of the first signal pads is configured to be electrically connected to at least one of signal traces of a membrane core inserted into the opening. All of the signal channels are electrically connected to all of the first signal pads respectively. All of the second signal pads are electrically connected to all of the signal channels respectively.