Universal Test Board With Segmented DUT Holders
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Solution Overview
Problem
Existing testing apparatuses are inefficient and inaccurate due to the need for custom-made test boards for each type of electronic device, requiring manual welding of wires which is time-consuming and labor-intensive, and can't accommodate multiple devices simultaneously due to space constraints.
Innovation Solution
A testing apparatus comprising a public test board and a single DUT test board with specifically arranged signal terminals and traces, along with a holder designed for a specific DUT, allowing for efficient signal transmission and accommodating multiple DUTs of the same or different types by optimizing the arrangement of sockets, pins, and signal terminals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If custom-made test boards are used for each type of DUT, then testing accuracy is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent implements a universal test board design that can accommodate multiple types of DUTs through configurable signal terminal arrangements and programmable routing. The test board includes multiple sets of signal terminals that can be electrically connected to different DUT configurations, eliminating the need for custom-made test boards for each DUT type while maintaining testing accuracy through precise signal routing control.
2Reliability
If manual welding of wires is performed to connect signal terminals, then connectivity is achieved, but productivity decreases and labor consumption increases
Solution Approach 1:
The patent employs pre-configured electrical connection structures where signal terminals are arranged and connected before actual DUT testing begins. The test board includes pre-established trace patterns and connection pathways that are prepared in advance, eliminating the need for manual wire welding during the testing process. This preliminary configuration maintains reliable signal connectivity while dramatically improving productivity by removing time-consuming manual assembly steps.
3Productivity
If multiple holders are placed on the test board to test multiple DUTs simultaneously, then productivity is improved, but space constraints and wiring complexity increase
Solution Approach 1:
The patent divides the test board into multiple independent testing regions, each with its own set of signal terminals and connection pathways. Each region can accommodate a holder for a DUT, and the regions are spatially segmented to minimize interference and wiring complexity. This segmentation allows multiple DUTs to be tested simultaneously in parallel while efficiently utilizing the test board space and reducing the complexity of interconnections compared to shared routing approaches.
Data Source
AI summary
A testing apparatus includes a public test board, a single DUT (device under test) test board and a holder. The public test board includes a plurality of public test channel sets each having a plurality of public signal terminals for receiving test signals. On the single DUT test board, a plurality first signal terminals are arranged according to the pin layout of a DUT, a plurality second signal terminals are arranged according to the terminal layout of a public channel set, and a plurality traces are arranged for electrically connecting corresponding first and second signal terminals. The holder can connect the pins of the DUT to corresponding first signal terminals.