Universal Tester for Electro-Optical Hosts
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Solution Overview
Problem
Current testing systems for electro-optical equipment are costly and lack scalability, making them inefficient for testing a variety of electro-optical modules with different standards and signal types.
Innovation Solution
A universal tester system that includes host interface slots compatible with multiple module standards, a stressor generator for simulating signal impairments, and a signal processor for generating stressed signals in both electrical and optical modes, allowing for flexible testing configurations including pass-through and loop-back modes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If specialized testing equipment is used for electro-optical equipment, then testing capability is provided, but cost increases and scalability is reduced
Solution Approach 1:
The host interface slot is designed to accept both electrical host cards and optical host cards, allowing a single testing system to perform both electrical and optical testing functions. The system can dynamically switch between testing modes based on the inserted card type, eliminating the need for separate specialized testing equipment for electrical and optical components.
2Measurement precision
If separate testing systems are used for electrical and optical signals, then specialized testing capability is achieved, but system complexity and cost increase
Solution Approach 1:
The patent combines electrical and optical testing capabilities into a single integrated system. The host interface slot accepts different card types (electrical or optical), and the system merges the testing functions by dynamically configuring the stressor generator and signal processing based on the detected card type, thereby reducing the need for multiple separate testing systems.
3Adaptability or versatility
If the system supports multiple module standards, then versatility is improved, but device complexity increases
Solution Approach 1:
The host interface slot is designed as a universal interface that can accommodate different module standards (electrical and optical). The system detects the inserted module type and automatically configures the appropriate testing parameters and signal processing, providing multi-standard support without requiring separate dedicated interfaces for each standard.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The universal tester system enables cost-effective, scalable testing of electro-optical equipment across different standards and signal types, improving the ability to detect and report errors, and verifying the performance of hosts under various signal conditions.
Implementation Method 1
the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test
Data Source
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AI summary
According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.