Universal Wireless Device Tester with Asynchronous Web Socket Probes
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Solution Overview
Problem
Current device testing systems are limited in their ability to simultaneously test multiple devices of different types without requiring significant architectural changes and do not allow for seamless integration of new devices or tests.
Innovation Solution
A system with a core testing subsystem, user interface, and asynchronous communication via web sockets that enables simultaneous testing of disparate devices by dynamically loading test configurations and executing tests through a universal tester, using probes for various interfaces, and storing results for aggregation and reporting.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a traditional device testing system is used, then testing can be performed on individual devices, but the system cannot simultaneously test multiple devices of different types without significant architectural changes
Solution Approach 1:
The patent implements a universal tester that can test multiple types of devices (wireless devices, wired devices, mobile devices, tablets, laptops, etc.) through a single unified platform. The tester uses standardized interfaces and protocols to communicate with diverse device types, eliminating the need for separate testing systems for each device category while maintaining comprehensive testing capabilities across all device types.
Solution Approach 2:
The testing system is divided into independent modular components including the universal tester, multiple probes (WiFi probe, Ethernet probe, MoCA probe), and separate testing slots. Each module can be independently configured and operated, allowing the system to adapt to different device types by activating only the necessary probes and testing components, thereby reducing overall system complexity while maintaining versatility.
2Adaptability or versatility
If a traditional testing system is used, then the system structure remains fixed, but new devices or tests cannot be seamlessly integrated
Solution Approach 1:
The system employs dynamic configuration capabilities where testing parameters, probe selections, and test sequences can be adjusted in real-time based on the specific device being tested. The universal tester can dynamically load appropriate test configurations for different device types and seamlessly integrate new devices by updating test configurations without requiring physical system reconfiguration or architectural changes.
Solution Approach 2:
The patent introduces standardized communication interfaces and protocol layers that act as intermediaries between the universal tester and diverse device types. These intermediary layers enable new devices to be integrated by implementing standard communication protocols, allowing the system to accommodate new device types without modifying the core tester architecture, thus maintaining ease of manufacture while achieving high adaptability.
3Productivity
If multiple devices are tested sequentially in separate systems, then each device receives dedicated testing resources, but testing time and efficiency are reduced
Solution Approach 1:
The universal tester combines multiple testing capabilities and resources into a single integrated platform, allowing multiple devices to be tested simultaneously in different slots using the same tester and probe resources. This merging of resources enables parallel testing of multiple devices, significantly improving productivity while reducing the total time required compared to sequential testing with separate systems.
Solution Approach 2:
The system maintains continuous testing operations by allowing multiple devices to be tested in parallel across different slots simultaneously. The universal tester can continuously utilize its resources by switching between and concurrently testing multiple devices, eliminating idle time and ensuring that testing resources are productively engaged throughout the entire testing process, thereby maximizing efficiency and minimizing total testing duration.
Data Source
AI summary
A system for testing multiple wireless devices independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between system components.