Upper Dome Chamber Structure for Faster Epitaxial Heating
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
As semiconductor integrated circuits become more integrated, the smaller size of transistors formed by the epitaxial process in conventional semiconductor process chambers leads to increased process defects due to challenges in achieving uniform temperature and reducing processing time.
Innovation Solution
The semiconductor process chamber design includes a susceptor, base plate, upper and lower domes, and a liner on the inner sidewall, with the upper dome having a unique transparent section that reduces the processing space volume, allowing for faster temperature reach and reduced temperature variation, utilizing lamps and reflectors for efficient heating.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a conventional semiconductor process chamber is used, then the chamber can accommodate standard processing requirements, but the processing time is extended and temperature uniformity deteriorates due to larger volume
Solution Approach 1:
The chamber volume is segmented by introducing a susceptor with a through-hole that divides the processing space into upper and lower sections. This segmentation reduces the effective volume that needs to be heated, thereby decreasing processing time while maintaining temperature uniformity in each section.
Solution Approach 2:
The invention introduces a vertical dimensionality change by creating an upper dome and lower dome structure around the susceptor. This three-dimensional configuration reduces the horizontal processing volume while maintaining adequate processing space, effectively reducing chamber volume without compromising processing capability.
2Loss of time
If the chamber volume is reduced to decrease processing time, then productivity improves, but temperature uniformity across the wafer surface may deteriorate
Solution Approach 1:
The upper dome and lower dome are designed with different transparency characteristics. The upper dome is more transparent to allow efficient light transmission for heating, while the lower dome provides appropriate shielding. This local quality differentiation optimizes heat distribution and maintains temperature uniformity across the wafer surface.
Solution Approach 2:
Temperature sensors are strategically positioned to monitor temperature distribution within the reduced volume chamber. This feedback mechanism allows real-time adjustment of heating parameters to maintain uniform temperature across the wafer surface despite the reduced chamber volume.
3Use of energy by moving object
If the upper dome is made more transparent to improve heating efficiency, then energy utilization improves, but structural strength and sealing capability may deteriorate
Solution Approach 1:
The upper dome is constructed using composite materials that combine high transparency to light with adequate mechanical strength. This allows the dome to transmit heating light efficiently while maintaining the structural integrity required for vacuum sealing and withstanding processing conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design reduces the time to reach target process temperatures, minimizes temperature variations, and decreases defects in forming epitaxial semiconductor layers, thereby enhancing productivity.
Implementation Method 1
upper dome having a unique transparent section that reduces the processing space volume, allowing for faster temperature reach and reduced temperature variation, utilizing lamps and reflectors for efficient heating
Implementation Method 2
upper lamps coupled to the upper reflector, a lower reflector configured to reflect light towards the susceptor through the lower dome and lower lamps coupled to the lower reflector
Data Source
AI summary
A semiconductor process chamber includes a susceptor, a base plate surrounding the susceptor, a liner on an inner sidewall of the base plate, and a preheat ring between the susceptor and the base plate and coplanar with the susceptor. The process chamber further includes an upper dome coupled to the base plate and covering an upper surface of the susceptor. The upper dome includes a first section on an upper surface of the base plate and a second section extending from the first section and overlapping the susceptor. The first section includes a first region on the upper surface of the base plate, a second region extending from the first region past the base plate, and a third region extending from the second region with a decreasing thickness to contact the second section.


