Miniature USB Connector Test Device for Multimedia Data Card PCB
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Solution Overview
Problem
The development of multimedia data cards with enhanced multi-mode applications poses challenges in achieving a compact PCB layout due to the need for multiple test points, which complicates structural design and increases manufacturing costs, especially when using traditional test clamps and window-like structures.
Innovation Solution
A test device with a split connecting slot module and a miniature USB connector allows for efficient testing of multimedia data cards by eliminating the need for test clamps and reducing spatial requirements on the PCB, enabling stable and cost-effective connection of test points without compromising the product's appearance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional test clamps and window-like structures are used to test multiple points on the PCB, then test coverage is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The invention divides the test probe into multiple independent testing units, each capable of testing different points simultaneously. This segmentation allows comprehensive test coverage without requiring complex window structures or multiple separate test clamps, thereby reducing device complexity while maintaining measurement precision.
Solution Approach 2:
The test probe is designed with multiple testing units that can universally test various points on the PCB. This multi-functional design eliminates the need for specialized window structures or multiple separate test clamps for different test points, reducing both device complexity and manufacturing cost while achieving comprehensive test coverage.
2Measurement precision
If multiple test points are arranged on the PCB surface, then test coverage is improved, but the area occupied on the PCB increases
Solution Approach 1:
The invention transitions from a two-dimensional arrangement of test points on the PCB surface to a three-dimensional structure where multiple testing units are vertically positioned. This dimensional change allows multiple test points to be accessed without proportionally increasing the PCB surface area, as the testing units can be arranged in a compact vertical configuration.
Solution Approach 2:
The multiple testing units are designed to be nested or closely integrated within a compact probe structure. This nesting approach allows multiple test functions to be contained within a small footprint, enabling comprehensive test coverage without occupying excessive PCB surface area.
3Measurement precision
If test clamps are re-positioned for each test point, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The test probe is pre-configured with multiple testing units positioned to simultaneously access all required test points. This preliminary positioning eliminates the need for re-positioning test clamps between measurements, allowing all test points to be tested in a single operation, thereby significantly improving productivity while maintaining measurement precision.
Solution Approach 2:
The invention enables continuous testing of multiple points simultaneously through the multi-unit probe design. All testing units operate concurrently in a single continuous action, eliminating the intermittent re-positioning steps required by traditional methods. This continuous parallel operation maintains measurement precision while dramatically improving test efficiency and productivity.
Data Source
AI summary
The present invention discloses a test device and a test method for a multimedia data card and a mobile-phone multimedia data card. The test device comprises a printed circuit board (PCB), and the PCB is provided with a connecting slot module that can be split and used for connecting modules under test. The test device for a multimedia data card comprises a miniature connector, which is plugged into the connecting slot module. According to the present invention, the PCB can be tested simply by connecting the PCB tester to the miniature USB connector, and the components can be easily plugged in without need of such operations as windowing and positioning. Therefore, the test efficiency is improved, and because the cost for developing test clamps to connect these test points is saved, the test cost and the manufacturing cost get reduced.