USB Test Control for Combined Power and Debug Data

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Solution Overview

Problem

Existing debugging techniques for devices under test require time-consuming wired connections and additional cables, leading to inefficiencies and reduced quality of debugging and management.

Innovation Solution

A test control device that supplies power to a device under test through a cable and enables both wired and wireless data transmission, allowing external electronic devices to debug or manage the device's functions and status.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If wired connection with additional cables is used for debugging, then reliable data transmission is achieved, but operation convenience deteriorates and time consumption increases

Engineering Contradiction:
Improvedata transmission reliabilityVSAvoiddebugging convenience
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent combines power transmission and data transmission functions into a single USB interface. The test control device integrates a voltage generator and data processor that share the same physical connector, allowing simultaneous power supply and debugging through one cable rather than requiring separate cables for each function.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The USB interface is designed to perform multiple functions: it can supply power to the device under test, transmit debug data, and establish communication protocols. The test control device can operate in different modes (power-only mode, debug mode, or combined mode) depending on the connection type, making the system universally applicable to various debugging scenarios.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Stability of the object's composition

If wired connection is used for debugging, then stable connection is achieved, but preparation time and complexity increase

Engineering Contradiction:
Improveconnection stabilityVSAvoidenvironment setup time
Core Design Contradiction:
Stability of the object's compositionVSLoss of time

Solution Approach 1:

The test control device automatically detects the connection type (wired or wireless) and configures itself accordingly. The processor identifies whether a USB device is connected and switches between debug modes automatically, eliminating the need for manual configuration and reducing setup time while maintaining connection stability when wired connection is available.

Inventive Principle:
Principle #25Self-service

3Adaptability or versatility

If traditional debugging interface is used, then device compatibility is maintained, but interface compatibility problems occur

Engineering Contradiction:
Improvedevice compatibilityVSAvoidinterface compatibility complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent uses the USB interface as a universal standard for both power and data transmission. By leveraging the widely adopted USB protocol and connector types, the test control device achieves broad compatibility with various devices while simplifying the interface requirements compared to traditional debugging setups that may require specialized connectors and protocols.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20250271502A1Test control device and operating method thereof
Publication Date: 2025.08.28 LITE ON TECH CORP
  • US20250271502A1 patent drawing
  • US20250271502A1 patent drawing
  • US20250271502A1 patent drawing

AI summary

A test control device and an operating method thereof are disclosed. The test control device includes a voltage generator and a data processor. The voltage generator is coupled to a device under test which is a universal serial bus interface through a first connector. The voltage generator is configured to generate a supply voltage to the device under test. The data processor receives a test signal sent by an external electronic device through a second connector. The data processor forwards the test signal to the device under test through the first connector. The processor receives a test feedback data from the device under test through the first connector.