UV-Cured Resist Encapsulation for Low-Temperature MEMS Sealing

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Solution Overview

Problem

Existing MEMS component encapsulation methods require high temperatures for soldering, which can cause thermomechanical stresses and increase manufacturing costs due to material expansion issues and the need for precise temperature control, making them unsuitable for sensitive components like SAW and FEAR devices.

Innovation Solution

A MEMS component with a UV-curable or thermally cured resist layer that encloses metallic column and frame structures, eliminating the need for soldering and allowing for low-temperature processing, along with a carrier layer for mechanical stability and hermetic sealing, ensuring minimal thermal loading and reduced manufacturing rejects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If soldering is used to enclose the cavity, then hermetic sealing is achieved, but elevated temperatures cause thermomechanical stresses and component property deviations

Engineering Contradiction:
Improvehermetic sealing reliabilityVSAvoidprocessing temperature
Core Design Contradiction:
ReliabilityVSTemperature

Solution Approach 1:

The invention changes the curing parameter from thermal (soldering at elevated temperatures) to photonic (UV curing at room temperature). The resist layer is formulated to cure upon UV irradiation rather than requiring thermal activation, thereby eliminating thermomechanical stresses while achieving hermetic sealing of the cavity.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention replaces the thermal-mechanical soldering process with a photopolymerization process. Instead of using heat and mechanical pressure to melt and bond solder, the system uses UV light to initiate chemical bonding in the resist layer, substituting a thermal-mechanical system with a photonic-chemical system that operates at room temperature.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Temperature

If UV-curing resist is used to close the cavity, then low processing temperatures are achieved, but the structural strength may be insufficient compared to solder

Engineering Contradiction:
Improveprocessing temperatureVSAvoidcavity closure strength
Core Design Contradiction:
TemperatureVSStrength

Solution Approach 1:

The invention uses a composite structure where the resist layer is combined with metallic frame and column structures. The resist provides hermetic sealing through UV-cured polymer bonds, while the metallic structures provide mechanical reinforcement. This composite approach compensates for the potentially lower strength of the polymer resist while maintaining low processing temperatures.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The invention applies different material properties to different regions: the resist layer provides hermetic sealing in the cavity regions, while metallic frame and column structures provide localized mechanical strength where needed. This local differentiation of material qualities allows the system to achieve both low-temperature processing and sufficient structural strength.

Inventive Principle:
Principle #3Local quality

3Reliability

If conventional encapsulation methods are used, then hermetic sealing is achieved, but manufacturing costs increase due to temperature control requirements and material expansion issues

Engineering Contradiction:
Improvehermetic sealingVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The resist layer serves multiple functions simultaneously: it acts as a sealant for hermetic closure, as a structural element defining the cavity, and as an adhesive bonding the metallic components. This multi-functionality eliminates the need for separate materials and processes, thereby reducing manufacturing complexity and cost while maintaining hermetic sealing.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The invention changes the processing parameter from high-temperature thermal processes to room-temperature UV photopolymerization. This parameter change eliminates the need for expensive temperature control equipment and reduces material expansion issues, thereby lowering manufacturing costs while achieving reliable hermetic sealing.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method enables cost-effective, reliable production of MEMS components with hermetic cavities that are less susceptible to damage and property alterations, maintaining mechanical and electrical stability while avoiding elevated temperatures, thus improving manufacturing efficiency and reducing component failure rates.

Implementation Method 1

The resist layer can be UV-cured or thermally cured

Methodology Applied
Scientific EffectUV-curing: Photopolymerisation

Implementation Method 2

The component structures together with a portion of the column structures are arranged in a cavity that is formed and closed off by a cured resist layer

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS10164166B2MEMS component and method for encapsulating MEMS components
Publication Date: 2018.12.25 SNAPTRACK INC
  • US10164166B2 patent drawing
  • US10164166B2 patent drawing
  • US10164166B2 patent drawing

AI summary

A MEMS component includes, on a substrate, component structures, contact areas connected to the component structures, metallic column structures seated on the contact areas, and metallic frame structures surrounding the component structures. A cured resist layer is seated on frame structure and column structures such that a cavity is enclosed between substrate, frame structure and resist layer. A structured metallization is provided directly on the resist layer or on a carrier layer seated on the resist layer. The structured metallization includes at least external contacts of the component and being electrically conductively connected both to metallic structures and to the contact areas of the component structures.