UV LED p-Type AlGaInN Hydrogen Removal Without Output Loss

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Light-emitting elements with nitride semiconductors face significant output decreases due to hydrogen migration from p-type nitride semiconductor layers, especially in high Al composition layers, where hydrogen is difficult to remove without affecting the light-emitting performance.

Innovation Solution

A method involving the use of ultraviolet light irradiation and heat treatment in a nitrogen or nitrogen-oxygen atmosphere at elevated temperatures, with specific voltage conditions, to efficiently remove hydrogen from the p-type layer of high Al composition nitride semiconductors without reducing the light-emitting element's output.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional heat treatment is applied to remove hydrogen from p-type nitride semiconductor layers, then hydrogen removal is achieved, but light-emitting element output decreases significantly

Engineering Contradiction:
Improvehydrogen removal effectivenessVSAvoidlight-emitting element output
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The invention changes the parameters of heat treatment by introducing specific atmosphere compositions (N2 with O2 content of 1-20 vol%, preferably 5-15 vol%) and temperature ranges (400-700°C, preferably 500-650°C) to achieve effective hydrogen removal while preventing output degradation. The atmospheric composition parameter is specifically optimized to enable hydrogen removal without causing the harmful effects seen in conventional treatments.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention uses an intermediary atmosphere composition (N2 with controlled O2 content) as a mediator between the hydrogen-containing p-type layer and the light-emitting layer. This intermediary atmosphere enables hydrogen removal while the N2-O2 mixture prevents the direct harmful interaction that causes output degradation, acting as a controlled medium for the hydrogen removal process.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Object-affected harmful factors

If high Al composition is used in p-type layer to suppress light absorption, then light absorption is reduced, but hydrogen retention increases making removal difficult

Engineering Contradiction:
Improvelight absorptionVSAvoidhydrogen retention ability
Core Design Contradiction:
Object-affected harmful factorsVSReliability

Solution Approach 1:

The invention changes the atmospheric parameters to N2 with controlled O2 content (1-20 vol%) and adjusts treatment temperature (400-700°C) to overcome the high hydrogen retention ability of high Al composition materials. This parameter change enables effective hydrogen removal from AlGaN layers with Al composition of 20-100%, which previously resisted conventional hydrogen removal methods.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention introduces oxygen (1-20 vol% in N2 atmosphere) as a strong oxidizing agent to accelerate hydrogen removal from high Al composition p-type layers. The oxidizing environment facilitates the breakdown of strong Al-H bonds that normally retain hydrogen, enabling effective hydrogen removal from materials with high light transmission properties.

Inventive Principle:
Principle #38Strong oxidants (Accelerated oxidation)

3Power

If short wavelength light emission is implemented, then high energy output is achieved, but hydrogen separation from p-type layer increases

Engineering Contradiction:
Improveemission energyVSAvoidhydrogen separation
Core Design Contradiction:
PowerVSObject-generated harmful factors

Solution Approach 1:

The invention applies preliminary heat treatment with N2-O2 atmosphere (400-700°C, 1-20 vol% O2) to the p-type layer before the light-emitting element begins operation. This preliminary action removes hydrogen from the p-type layer in advance, preventing the high-energy short wavelength light from later causing hydrogen separation and migration to the light-emitting layer.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention applies preliminary anti-action by using N2-O2 atmosphere heat treatment to remove hydrogen from the p-type layer before operation. This preliminary anti-action counteracts the potential harmful effect of hydrogen separation that would otherwise be caused by high-energy short wavelength light emission during device operation.

Inventive Principle:
Principle #9Preliminary anti-action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Effectively removes hydrogen from the p-type layer of high Al composition nitride semiconductors, preventing output degradation of light-emitting elements while maintaining their performance.

Implementation Method 1

removing hydrogen in the p-type layer from the light-emitting element by irradiating the light-emitting element with ultraviolet light at a wavelength of not more than 306 nm

Methodology Applied
Scientific EffectUltraviolet light irradiation: Photoelectric Effect

Implementation Method 2

treating the light-emitting element with heat in a state in which a reverse voltage, or a forward voltage lower than a threshold voltage of the light-emitting element, or no voltage is applied

Methodology Applied
Scientific EffectHeat treatment: Heating

Data Source

PatentUS11916164B2Method for manufacturing light-emitting element and method for removing hydrogen from light-emitting element
Publication Date: 2024.02.27 TOYODA GOSEI CO LTD
  • US11916164B2 patent drawing
  • US11916164B2 patent drawing
  • US11916164B2 patent drawing

AI summary

A method for manufacturing a light-emitting element includes providing the light-emitting element that includes a light-emitting layer with an emission wavelength of not more than 306 nm and a p-type layer including AlGaInN including Mg as an acceptor, and removing hydrogen in the p-type layer from the light-emitting element by irradiating the light-emitting element with ultraviolet light at a wavelength of not more than 306 nm from outside and treating the light-emitting element with heat in a state in which a reverse voltage, or a forward voltage lower than a threshold voltage of the light-emitting element, or no voltage is applied to the light-emitting element. The removing of hydrogen in the p-type layer from the light-emitting element is performed in a N2 atmosphere at not less than 650° C. or in a N2+O2 atmosphere at not less than 500° C.