Deep Ultraviolet Raman Spectrometer for Sub-Micron Semiconductor Imaging

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Solution Overview

Problem

Conventional optical microscopes and Raman spectrometers face limitations in resolving small features due to the limitations of visible light, particularly in semiconductor research and manufacturing, where features smaller than 0.5 microns are challenging to observe, and the need for high-vacuum environments or complex light sources.

Innovation Solution

Utilizing the intense, monochromatic radiation of the Hydrogen Lyman-α line at 121.6 nm in the deep ultraviolet region, which allows for improved resolution and transmission through air without the need for a high vacuum, enabling the development of optical microscopes and Raman spectrometers that can effectively probe sub-micron features.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If visible light is used for optical microscopy, then the device is simple and easy to operate, but the resolution is insufficient for features smaller than 0.5 microns

Engineering Contradiction:
ImproveresolutionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent changes the wavelength parameter of light from visible range to deep ultraviolet range (121.6 nm), which directly improves resolution according to the diffraction limit formula. This parameter change enables observation of sub-0.5 micron features while maintaining optical microscopy simplicity

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If deep ultraviolet light at 121.6 nm is used, then resolution increases four-fold, but atmospheric absorption would normally prevent transmission

Engineering Contradiction:
ImproveresolutionVSAvoidatmospheric absorption
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent exploits the local quality feature of atmospheric transmission by identifying and utilizing the specific wavelength window at 121.6 nm where oxygen absorption has a local minimum. This allows deep ultraviolet light to transmit through air without requiring vacuum conditions, resolving the contradiction between improved resolution and atmospheric absorption

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent uses the atmospheric window at 121.6 nm as an intermediary that mediates between the deep ultraviolet light source and the atmosphere. This natural transmission window acts as a bridge allowing VUV light to pass through air, eliminating the need for vacuum systems

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If N VII radiation at 2.48 nm is used, then water absorption by biological specimens is reduced, but the light source requires complicated equipment and high vacuum

Engineering Contradiction:
Improvepenetration depthVSAvoidlight source complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces expensive, complex, and fragile deep VUV light sources (N VII radiation requiring pinched plasma sources and high-powered pulsed lasers) with a simpler, more reliable hydrogen discharge lamp. This substitution maintains the scientific benefit while eliminating the need for complicated equipment and high vacuum systems

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach provides a four-fold increase in resolution, allowing for enhanced viewing and probing of small features without the complexity and cost of traditional high-vacuum systems, and significantly improves Raman scattering intensity, enabling high-resolution imaging and spectroscopy of semiconductor devices.

Implementation Method 1

utilizing the intense, monochromatic radiation of the Hydrogen Lyman-α line at 121.6 nm in the deep ultraviolet region

Methodology Applied
Scientific EffectLyman-α radiation: Light

Implementation Method 2

a hydrogen discharge lamp that produces intense ultraviolet radiation at the hydrogen Lyman-α line

Methodology Applied
Scientific EffectHydrogen discharge: Electric Glow Discharge

Implementation Method 3

within which a local minimum in the absorption coefficient of Oxygen occurs

Methodology Applied
Scientific EffectAbsorption minimum: Absorption (EM radiation)

Implementation Method 4

a lens device that receives a first portion of the generated light, directs at least some of the first portion of the generated light toward a target location, receives reflected light from the target location, and directs the reflected light toward a further location

Methodology Applied
Scientific EffectLight refraction and reflection: Refraction

Implementation Method 5

the camera device receives a first amount of the reflected light, whereby an image is generated by the camera device based upon the first amount of the reflected light

Methodology Applied
Scientific EffectLight detection: Photoelectric Effect

Implementation Method 6

Raman spectroscopy, which employs Raman scattering

Methodology Applied
Scientific EffectRaman scattering: Scattering

Data Source

PatentUS7916291B2Apparatus and method for spectroscopy
Publication Date: 2011.03.29 INVENTTECH
  • US7916291B2 patent drawing
  • US7916291B2 patent drawing
  • US7916291B2 patent drawing

AI summary

Apparatuses and methods for performing spectroscopy and optical microscopy are disclosed. In at least one embodiment, a Raman spectrometer includes a vacuum ultraviolet light source configured to generate light having a wavelength within a window in the vacuum ultraviolet region of the electromagnetic spectrum within which a local minimum in the absorption coefficient of Oxygen occurs. The spectrometer also includes a lens device that receives a first portion of the generated light, directs at least some of the first portion of the generated light toward a target location, receives reflected light from the target location, and directs the reflected light toward a further location. The spectrometer further includes a dispersive device that receives at least some of the reflected light and outputs dispersed light produced based thereupon, and a camera module that is positioned at additional location, where the camera module receives at least some of the dispersed light.