Colored UV Shielding Layer for Oxide Semiconductor Transistors
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Solution Overview
Problem
Transistors made from oxide semiconductor materials are vulnerable to damage from ultraviolet light exposure during photolithography, leading to defects, instability, and reduced reliability due to the creation of oxygen vacancy states and photogenerated holes.
Innovation Solution
A colored light shielding layer is applied over the semiconductor layer to reduce exposure to ultraviolet radiation, thereby minimizing damage and defects. This layer is made from materials such as metal oxides, p-type oxide semiconductors, or perovskites, which provide high chemical and physical resistance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If photolithography process is used to manufacture transistors, then manufacturing precision and productivity are improved, but ultraviolet light exposure causes oxygen vacancy states and photogenerated holes in oxide semiconductor layers, worsening reliability and stability
Solution Approach 1:
A colored light shielding layer is introduced as an intermediary between the ultraviolet light source and the oxide semiconductor layer. This layer selectively blocks harmful UV wavelengths while allowing the photolithography process to proceed, thus protecting the semiconductor from damage without compromising manufacturing precision
Solution Approach 2:
The patent converts the harmful effect of ultraviolet light into a beneficial filtering process by using the colored light shielding layer to selectively absorb UV wavelengths. The layer transforms the potentially damaging radiation into a protected environment, allowing photolithography to proceed safely
2Reliability
If oxide semiconductor materials are used, then transistor performance is improved, but the materials are vulnerable to ultraviolet light damage, worsening stability
Solution Approach 1:
The colored light shielding layer is applied in advance before photolithography exposure to prevent ultraviolet light from reaching the oxide semiconductor layer. This preliminary protective action prevents the formation of oxygen vacancy states and photogenerated holes before they can occur
Solution Approach 2:
The shielding layer acts as a protective intermediary that selectively filters UV radiation while allowing the oxide semiconductor to maintain its high-performance characteristics. The layer preserves the semiconductor's composition stability without compromising device performance
3Device complexity
If no light shielding layer is used, then device complexity is reduced, but semiconductor layers suffer from UV-induced defects, worsening manufacturing precision
Solution Approach 1:
The colored light shielding layer is deposited as a preliminary step in the manufacturing process, forming a protective barrier before photolithography. This preliminary action prevents defect generation without significantly increasing overall device complexity
Solution Approach 2:
The shielding layer is implemented as a thin film structure that provides effective UV protection while minimizing added complexity. The thin film approach maintains device simplicity while preventing manufacturing defects
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The implementation of the colored light shielding layer significantly reduces the generation of defects and instability in the semiconductor layer, enhancing the reliability and performance of the transistor by minimizing exposure to UV light and reducing oxygen vacancy states and photogenerated holes.
Implementation Method 1
A colored light shielding layer is applied over the semiconductor layer to reduce exposure to ultraviolet radiation
Data Source
AI summary
A transistor comprises a colored light shielding layer over the semiconductor layer thereof. The colored light shielding layer reduces exposure of the semiconductor layer to radiation having a wavelength of about 10 nanometers (nm) to about 400 nm. The colored light shielding layer may have a white, black, red, yellow, or gray color. The colored light shielding layer can be formed from a metal oxide film, a p-type oxide semiconductor, or a perovskite. The colored light shielding layer reduces defects that may be generated in the semiconductor layer due to UV light exposure during the manufacturing process, improving device performance and reliability.


