Vacuum Contact Alignment for Large-Area Electronic Test Boards
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Solution Overview
Problem
Conventional testing devices face challenges in accurately aligning probes of the probe head with conductive contact points on the detection board due to the large size of the detection board and the precision of the probes, leading to inaccurate test performance.
Innovation Solution
An electronic test device with negative-pressure-typed contact alignments, utilizing a test platform, circuit load board, annular elastic structure, probe modules, and airway assembly, where a vacuum is applied to compress the annular elastic structure, causing the circuit load board to descend and align probes with conductive contacts accurately.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the detection board is made large in size, then more contact points can be accommodated, but the alignment accuracy between probes and conductive contact points deteriorates
Solution Approach 1:
The detection board is segmented into multiple regions with different functions: a first detection region for initial contact and a second detection region for precise measurement. This segmentation allows the board to accommodate more contact points while maintaining alignment accuracy by distributing functions across different zones rather than requiring all contacts to be perfectly aligned in a single large area.
Solution Approach 2:
A fixture is introduced as an intermediary component between the detection board and the probes. The fixture includes positioning structures that mediate the alignment process, ensuring that probes are accurately positioned relative to conductive contact points even when the detection board is large in size. This intermediary mechanism resolves the contradiction by providing an additional alignment layer.
2Device complexity
If conventional alignment methods are used, then the device structure remains simple, but alignment accuracy and test performance deteriorate
Solution Approach 1:
A fixture is introduced as an intermediary component between the detection board and the probes. The fixture includes positioning structures that mediate the alignment process, ensuring that probes are accurately positioned relative to conductive contact points even when the detection board is large in size. This intermediary mechanism resolves the contradiction by providing an additional alignment layer.
Solution Approach 2:
The fixture performs preliminary positioning and alignment actions before the actual testing process begins. The positioning structures pre-establish the correct spatial relationships between probes and contact points, eliminating the need for complex real-time adjustment mechanisms during testing. This preliminary alignment action maintains device simplicity while achieving high precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The alignment of probes and conductive contacts is improved, enhancing the accuracy of test performance by ensuring precise alignment and electrical connection.
Implementation Method 1
When the internal space is evacuated through the airway assembly so as to drive the circuit load board to compress the annular elastic structure and the internal space toward the test platform
Implementation Method 2
the circuit load board to compress the annular elastic structure
Data Source
AI summary
An electronic test device with negative-pressure-typed contact alignment includes a test platform, a circuit load board, an annular elastic structure, a probe module and an airway assembly. The circuit load board loads and electrically connects to a device under test. The annular elastic structure is sandwiched between the test platform and the circuit load board, so that an internal space enclosed by the annular elastic structure and sandwiched between the test platform and the circuit load board becomes airtight. The probe module is disposed on the test platform and partially extends into the internal space. The airway assembly is located on the test platform and connected to the internal space.