Vacuum Pick-Up End Effector Pin Mechanism for Small Object Detection
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Solution Overview
Problem
Existing end effectors face challenges in reliably picking up small objects due to the small surface area, which results in low vacuum pressure differences between the object being picked up and not, leading to difficulties in detection and increased manufacturing process losses.
Innovation Solution
The end effector design incorporates a pin that protrudes to contact the object and moves within a pin pathway, allowing vacuum to be drawn through open bores, and features a mechanism where the pin closes off an atmospheric pathway to increase vacuum force and a residual vacuum retains the object, enabling reliable detection through pressure differences.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If vacuum is used to pick up small objects, then the objects can be manipulated, but the small surface area results in low vacuum pressure differences making detection difficult
Solution Approach 1:
The vacuum system is segmented into two separate pathways: a first vacuum pathway for picking up the object and a second vacuum pathway for detecting object presence. This segmentation allows the detection pathway to measure vacuum pressure independently with higher precision, resolving the contradiction between reliable detection and small pressure differences on small surfaces.
Solution Approach 2:
A pin mechanism acts as an intermediary between the object and the vacuum pathways. The pin transmits the object's presence to close the atmospheric pathway, converting the small surface area contact into a measurable mechanical action that triggers the detection mechanism, thereby improving detection reliability without requiring large pressure differences.
2Ease of operation
If the vacuum opening is smaller to enable lifting small parts, then the part can be picked up, but the vacuum flow is blocked and negative pressure is reduced
Solution Approach 1:
The vacuum system is divided into separate pathways with different functions. The first vacuum pathway uses a small opening optimized for picking up small parts, while the second vacuum pathway provides a separate route for vacuum generation and measurement. This segmentation allows the small opening to function effectively without being constrained by the need to maintain high negative pressure, as the second pathway compensates for the restricted flow.
3Reliability
If additional sensors are added to improve detection, then object detection reliability increases, but device complexity and manufacturing costs increase
Solution Approach 1:
The system uses its existing vacuum generation mechanism to serve dual purposes: both picking up objects and detecting their presence. The pin mechanism and atmospheric pathway closure provide a self-contained detection method that leverages the vacuum system's own operation, eliminating the need for external sensors and reducing device complexity while maintaining high detection reliability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design significantly increases the pressure delta between picking up and not picking up an object, enhancing the reliability of object detection and reducing manufacturing process losses without the need for additional sensors, thus improving efficiency and yield.
Implementation Method 1
a first vacuum pathway (104) configured to terminate in a first open bore (105) at an item facing surface (103) of the end effector. A vacuum may be drawn selectively through the vacuum port (112)
Implementation Method 2
the sensed difference between the negative pressures when the end effector has not yet picked up the part and the negative pressure sensed when the end effector has indeed picked up the part
Implementation Method 3
A pin (108) may be configured for constrained movement within a pin pathway (110). The pin (108) may be configured to close off an atmospheric pathway (114) from the pin pathway (110)
Implementation Method 4
the vacuum may be turned off. The item may then be retained against the item facing surface (103) for a period of time through the force of residual vacuum in the first vacuum pathway (104)
Data Source
AI summary
An end effector configured to pick up an item may comprise a vacuum port through which a vacuum is selectively drawn, a first vacuum pathway in communication with the vacuum port and defining a first open bore, a pin pathway and a pin disposed within the pin pathway and configured for constrained movement therein. The pin may be further configured to protrude from the end effector body, to contact the item and to move within the pin pathway until the item contacts the first open bore and is retained by the end effector by the force of the vacuum. Turning off the vacuum may cause residual vacuum in the first vacuum pathway to retain the item for a period of time and/or until the pin drops under its own weight within the pin pathway to contact and separate the item from the end effector.