Vacuum Inspection Jig for Flexible Substrate Alignment

Solution Overview

Problem

Position alignment between terminals of a flexible substrate and an inspection device is often failed during inspection, leading to incorrect electric connection and measurement results, making it difficult to determine if alignment has succeeded.

Innovation Solution

An inspection jig with a vacuum attraction mechanism, featuring through holes in the flexible substrate and corresponding vacuum attraction holes in the inspection device, allows for easy determination of alignment success by applying force to the attraction part.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the holding part presses the flexible substrate toward the inspection device to establish electric connection, then electric connection between terminals is achieved, but position alignment between terminals may fail or be displaced

Engineering Contradiction:
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent introduces a vacuum attraction mechanism as an intermediary between the holding part and the flexible substrate. The vacuum attraction hole in the inspection device creates a vacuum field that holds the flexible substrate in position through atmospheric pressure, serving as a mediator that maintains alignment without direct mechanical pressing that could cause displacement

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the traditional mechanical pressing system with a vacuum-based holding system. Instead of using mechanical force from the holding part to press the substrate, the system uses vacuum attraction through the attraction hole to hold the substrate in place, substituting mechanical contact with a field-based holding mechanism

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Difficulty of detecting and measuring

If visual confirmation or camera inspection is used to determine position alignment success, then alignment status can be observed, but the holding part obstructs the view of terminal overlapping state

Engineering Contradiction:
Core Design Contradiction:
Difficulty of detecting and measuringVSDevice complexity

Solution Approach 1:

The patent extracts the detection function from the holding mechanism by introducing a separate vacuum attraction mechanism. The vacuum attraction hole and attraction part are positioned to provide clearance between the inspection device and the flexible substrate, removing the visual obstruction caused by the traditional holding part while maintaining alignment functionality

Inventive Principle:
Principle #2Taking out (Extraction)

3Reliability

If the flexible substrate is pressed by the holding part to ensure contact, then electric connection is established, but the terminals may be displaced from each other

Engineering Contradiction:
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent replaces the mechanical pressing system with a vacuum-based holding system. The vacuum attraction mechanism holds the flexible substrate through atmospheric pressure acting on the substrate surface, avoiding direct mechanical contact with the terminals that could cause displacement while maintaining stable positioning

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The vacuum attraction mechanism ensures reliable alignment confirmation, preventing erroneous measurements and identifying misalignment issues, thus ensuring accurate inspection results.

Implementation Method 1

insides of the first through hole and the vacuum attraction hole are made into vacuum, whereby the attraction surface is attracted to the flexible base material and the external connection terminal is attracted to the inspection terminal

Methodology Applied
Scientific EffectVacuum attraction: Vacuum

Data Source

PatentUS11971320B2Inspection jig
Publication Date: 2024.04.30
  • US11971320B2 patent drawing
  • US11971320B2 patent drawing
  • US11971320B2 patent drawing

AI summary

An inspection jig is used for inspection for an inspection target device including a flexible substrate having a flexible base material with external connection terminals formed thereon. The inspection jig is composed of an inspection device and an attraction part. The inspection device has inspection terminals, and the inspection terminals have vacuum attraction holes. The attraction part has an attraction surface. The external connection terminals have first through holes. In inspection, the attraction part is placed on the front surface of the flexible base material so that the first through holes and the vacuum attraction holes overlap each other and the attraction surface covers the first through holes, and the insides of the first through holes and the vacuum attraction holes are made into vacuum, whereby the attraction surface is attracted to the flexible base material and the external connection terminals are attracted to the inspection terminals.